Colton, R. J. and Baker, S. M. and Baldeschwieler, J. D. and Kaiser, W. J. (1987) "Oxide-free" tip for scanning tunneling microscopy. Applied Physics Letters, 51 (5). pp. 305-307. ISSN 0003-6951. http://resolver.caltech.edu/CaltechAUTHORS:COLapl87
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We report a new tip for scanning tunneling microscopy and a tip repair procedure that allows one to reproducibly obtain atomic images of highly oriented pyrolytic graphite with previously inoperable tips. The tips are shown to be relatively oxide-free and highly resistant to oxidation. The tips are fabricated with graphite by two distinct methods.
|Additional Information:||Copyright © 1987 American Institute of Physics. Received 9 April 1987; accepted 8 June 1987. We gratefully acknowledge helpful discussions with M. Weimer, J. Kramar, R. Driscoll, M. Youngquist, and T. Coley and the technical assistance of P. Koen of the Caltech Electron Microscope Facility and J. Wandass and R. Jones of the Naval Research Laboratory Surface Chemistry Branch. This material is based upon work supported under a National Science Foundation Graduate Fellowship and by the Office of Naval Research, the National Institute of Health, and the Shell Companies Foundation. One of us (W.J.K.) wishes to acknowledge the support of SDIO/Innovative Science and Technology Office through an agreement with NASA.|
|Subject Keywords:||SURFACE STRUCTURE, OXIDATION, FABRICATION, GRAPHITE, TUNNEL EFFECT, ELECTRON MICROSCOPY, ELECTRON MICROSCOPES, SCANNING ELECTRON MICROSCOPY, SAMPLE PREPARATION, OPERATION|
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|Deposited On:||16 Apr 2008|
|Last Modified:||26 Dec 2012 09:57|
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