Tighe, T. S. and Worlock, J. M. and Roukes, M. L. (1997) Direct thermal conductance measurements on suspended monocrystalline nanostructures. Applied Physics Letters, 70 (20). pp. 2687-2689. ISSN 0003-6951. http://resolver.caltech.edu/CaltechAUTHORS:TIGapl97
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We describe and demonstrate a new class of devices that enable direct thermal conductance measurements on monocrystalline nanostructures. These are possible through our newly developed techniques for three-dimensional, successive surface nanomachining of GaAs-based heterostructures. Our methods allow the patterning of complex devices comprising electrically insulating, mesoscopic thermal conductors with separate, thermal transducers in situ. Intimate thermal contact between these elements is provided by their epitaxial registry. Low-temperature thermal conductance measurements indicate that phonon boundary scattering in these initial nanometer is scale structures is partially specular. These devices offer promise for ultrasensitive bolometry and calorimetry.
|Additional Information:||©1997 American Institute of Physics. Received 17 December 1996; accepted 21 March 1997. The authors thank Axel Scherer and Larry Schiavone for important early contributions, and Leigh Florez, Jim Harbison, and Henry Lee for providing heterostructures critical to these efforts.|
|Subject Keywords:||nanostructured materials, thermal conductivity measurement|
|Usage Policy:||No commercial reproduction, distribution, display or performance rights in this work are provided.|
|Deposited By:||Archive Administrator|
|Deposited On:||19 May 2008|
|Last Modified:||26 Dec 2012 10:02|
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