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Direct thermal conductance measurements on suspended monocrystalline nanostructures

Tighe, T. S. and Worlock, J. M. and Roukes, M. L. (1997) Direct thermal conductance measurements on suspended monocrystalline nanostructures. Applied Physics Letters, 70 (20). pp. 2687-2689. ISSN 0003-6951.

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We describe and demonstrate a new class of devices that enable direct thermal conductance measurements on monocrystalline nanostructures. These are possible through our newly developed techniques for three-dimensional, successive surface nanomachining of GaAs-based heterostructures. Our methods allow the patterning of complex devices comprising electrically insulating, mesoscopic thermal conductors with separate, thermal transducers in situ. Intimate thermal contact between these elements is provided by their epitaxial registry. Low-temperature thermal conductance measurements indicate that phonon boundary scattering in these initial nanometer is scale structures is partially specular. These devices offer promise for ultrasensitive bolometry and calorimetry.

Item Type:Article
Additional Information:©1997 American Institute of Physics. Received 17 December 1996; accepted 21 March 1997. The authors thank Axel Scherer and Larry Schiavone for important early contributions, and Leigh Florez, Jim Harbison, and Henry Lee for providing heterostructures critical to these efforts.
Subject Keywords:nanostructured materials, thermal conductivity measurement
Record Number:CaltechAUTHORS:TIGapl97
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:10579
Deposited By: Archive Administrator
Deposited On:19 May 2008
Last Modified:26 Dec 2012 10:02

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