Bar-Chaim, N. and Lanir, M. and Margalit, S. and Ury, I. and Wilt, D. and Yust, M. and Yariv, A. (1980) Be-implanted (GaAl)As stripe geometry lasers. Applied Physics Letters, 36 (4). pp. 233-235. ISSN 0003-6951 http://resolver.caltech.edu/CaltechAUTHORS:BARapl80
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Abstract
GaAl)As double-heterostructure stripe geometry lasers have been fabricated using Be ion implantation. Pulsed threshold currents as low as 21 mA have been found. The light-vs-current characteristics were kink-free up to 10 mW output power and the measured differential quantum efficiency was 45%.
| Item Type: | Article |
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| Additional Information: | Copyright © 1980 American Institute of Physics. (Received 27 September 1979; accepted for publication 28 November 1979) The authors would like to thank Pat Koen of the California Institute of Technology for the SEM photomicrograph. This work was supported by the Office of Naval Research and the National Science Foundation. |
| Subject Keywords: | SEMICONDUCTOR LASERS, ION IMPLANTATION, GALLIUM ARSENIDES, ALUMINUM ARSENIDES, GEOMETRY, BERYLIUM IONS, FABRICATION, DATA, PULSES, ELECTRIC CURRENTS, VISIBLE RADIATION, EFFICIENCY |
| Record Number: | CaltechAUTHORS:BARapl80 |
| Persistent URL: | http://resolver.caltech.edu/CaltechAUTHORS:BARapl80 |
| Alternative URL: | http://dx.doi.org/10.1063/1.91457 |
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. |
| ID Code: | 10605 |
| Collection: | CaltechAUTHORS |
| Deposited By: | Archive Administrator |
| Deposited On: | 21 May 2008 |
| Last Modified: | 26 Dec 2012 10:03 |
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