Gao, Jiansong and Daal, Miguel and Martinis, John M. and Vayonakis, Anastasios and Zmuidzinas, Jonas and Sadoulet, Bernard and Mazin, Benjamin A. and Day, Peter K. and Leduc, Henry G. (2008) A semiempirical model for two-level system noise in superconducting microresonators. Applied Physics Letters, 92 (21). Art. No. 212504. ISSN 0003-6951 http://resolver.caltech.edu/CaltechAUTHORS:GAOapl08b
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We present measurements of the low-temperature excess frequency noise of four niobium superconducting coplanar waveguide microresonators, with center strip widths sr ranging from 3 to 20 µm. For a fixed internal power, we find that the frequency noise decreases rapidly with increasing center strip width, scaling as 1/s<sub>r</sub><sup>1.6</sup>. We show that this geometrical scaling is readily explained by a simple semiempirical model which assumes a surface distribution of independent two-level system fluctuators. These results allow the resonator geometry to be optimized for minimum noise.
|Additional Information:||©2008 American Institute of Physics. Received 2 April 2008; accepted 9 May 2008; published 29 May 2008. We thank Clare Yu and Sunil Golwala for useful discussions. The device was fabricated in the University of California, Berkeley, Microfabrication Laboratory. This work was supported in part by the NASA, NSF, JPL, and the Gordon and Betty Moore Foundation.|
|Subject Keywords:||coplanar waveguides, microstrip lines, niobium, superconducting device noise, superconducting microwave devices, superconducting resonators, superconducting thin films, thin film devices, type II superconductors|
|Usage Policy:||No commercial reproduction, distribution, display or performance rights in this work are provided.|
|Deposited By:||Archive Administrator|
|Deposited On:||02 Jun 2008|
|Last Modified:||26 Dec 2012 10:03|
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