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Digital signal processor control of scanned probe microscopes

Baselt, David R. and Clark, Steven M. and Youngquist, Michael G. and Spence, Charles F. and Baldeschwieler, John D. (1993) Digital signal processor control of scanned probe microscopes. Review of Scientific Instruments, 64 (7). pp. 1874-1882. ISSN 0034-6748. http://resolver.caltech.edu/CaltechAUTHORS:BASrsi93b

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Abstract

Digital signal processors have made it possible to control scanned probe microscopes using straightforward software emulations of analog circuits. Using a system consisting of a commercially available digital signal processor board interfaced to analog I/O, we have developed algorithms for self-optimizing feedback, raster generation (with hysteresis correction, sample tilt compensation, and scan rotation), lock-in detection, and automatic tip-sample approach. We also discuss an instruction parser that takes advantage of the digital architecture to allow automatic operation for extended periods.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1063/1.1144462PublisherUNSPECIFIED
http://link.aip.org/link/?RSINAK/64/1874/1PublisherUNSPECIFIED
Additional Information:Copyright © 1993 American Institute of Physics. Received 20 March 1992; accepted 17 March 1993. Financial support was provided by Ford Motor Company, Abbott Laboratories, Topometrix, Inc., a National Science Foundation predoctoral fellowship (D.R.B.), a National Institutes of Health traineeship (S.M.C.), and a Department of Education fellowship (M.G.Y.). We would like to thank Sie-Ting Wong of Abbott Laboratories for providing the bovine serum albumen sample and Shubert Soares for providing the polished quartz.
Funders:
Funding AgencyGrant Number
Ford Motor CompanyUNSPECIFIED
Abbott LaboratoriesUNSPECIFIED
Topometrix, Inc.UNSPECIFIED
National Science Foundation predoctoral fellowshipUNSPECIFIED
National Institutes of HEalth traineeshipUNSPECIFIED
Department of Education fellowshipUNSPECIFIED
Subject Keywords:SIGNAL PROCESSING, ELECTRON MICROSCOPES, DIGITAL CIRCUITS, ALGORITHMS, SCANNING TUNNELING MICROSCOPY, OPTICAL MICROSCOPES
Record Number:CaltechAUTHORS:BASrsi93b
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:BASrsi93b
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:11131
Collection:CaltechAUTHORS
Deposited By: Archive Administrator
Deposited On:17 Jul 2008 16:03
Last Modified:26 Dec 2012 10:09

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