Baselt, David R. and Clark, Steven M. and Youngquist, Michael G. and Spence, Charles F. and Baldeschwieler, John D. (1993) Digital signal processor control of scanned probe microscopes. Review of Scientific Instruments, 64 (7). pp. 1874-1882. ISSN 0034-6748. http://resolver.caltech.edu/CaltechAUTHORS:BASrsi93b
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Digital signal processors have made it possible to control scanned probe microscopes using straightforward software emulations of analog circuits. Using a system consisting of a commercially available digital signal processor board interfaced to analog I/O, we have developed algorithms for self-optimizing feedback, raster generation (with hysteresis correction, sample tilt compensation, and scan rotation), lock-in detection, and automatic tip-sample approach. We also discuss an instruction parser that takes advantage of the digital architecture to allow automatic operation for extended periods.
|Additional Information:||Copyright © 1993 American Institute of Physics. Received 20 March 1992; accepted 17 March 1993. Financial support was provided by Ford Motor Company, Abbott Laboratories, Topometrix, Inc., a National Science Foundation predoctoral fellowship (D.R.B.), a National Institutes of Health traineeship (S.M.C.), and a Department of Education fellowship (M.G.Y.). We would like to thank Sie-Ting Wong of Abbott Laboratories for providing the bovine serum albumen sample and Shubert Soares for providing the polished quartz.|
|Subject Keywords:||SIGNAL PROCESSING, ELECTRON MICROSCOPES, DIGITAL CIRCUITS, ALGORITHMS, SCANNING TUNNELING MICROSCOPY, OPTICAL MICROSCOPES|
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|Deposited On:||17 Jul 2008 16:03|
|Last Modified:||26 Dec 2012 10:09|
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