Blaum, Mario and Goodman, Rodney and McEliece, Robert (1988) The reliability of single-error protected computer memories. IEEE Transactions on Computers, 37 (1). pp. 114-119. ISSN 0018-9340 http://resolver.caltech.edu/CaltechAUTHORS:BLAieeetc88
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The lifetimes of computer memories which are protected with single-error-correcting-double-error-detecting (SEC-DED) codes are studies. The authors assume that there are five possible types of memory chip failure (single-cell, row, column, row-column and whole chip), and, after making a simplifying assumption (the Poisson assumption), have substantiated that experimentally. A simple closed-form expression is derived for the system reliability function. Using this formula and chip reliability data taken from published tables, it is possible to compute the mean time to failure for realistic memory systems.
|Additional Information:||© Copyright 1988 IEEE. Reprinted with permission. Manuscript received June 5, 1984; revised June 10, 1985. R. Goodman was supported by Caltech’s Program in Advanced Technologies, sponsored by Aerojet General, General Motors, GTE, and TRW. R. McEliece was supported by a grant from IBM.|
|Subject Keywords:||Error-correcting codes, RAM’S, reliability, SEC-DED codes, semiconductor memory systems|
|Usage Policy:||No commercial reproduction, distribution, display or performance rights in this work are provided.|
|Deposited By:||Archive Administrator|
|Deposited On:||28 Jul 2008 23:00|
|Last Modified:||26 Dec 2012 10:11|
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