Franklin, Joel N. (1981) Confidence Intervals for Stereological Estimators with Infinite Variance. SIAM Journal on Applied Mathematics, 40 (2). pp. 179-190. ISSN 0036-1399 http://resolver.caltech.edu/CaltechAUTHORS:FRAsiamjam81
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Abstract
A statistical estimator is discussed for using two-dimensional electron-microscope data to estimate NV, the number of organelles per unit volume. Under general assumptions, the estimator is shown to be the unique unbiased estimator of NV. Though the estimator has infinite variance, large samples are shown to yield an approximately normally distributed statistic from which confidence intervals for NV can be obtained.
| Item Type: | Article | ||||
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| Additional Information: | © 1981 Society for Industrial and Applied Mathematics. Received by the editors March 18, 1980, and in final form May 5, 1980. This research was partially supported by the National Science Foundation under grant MCS78-02198. Reproduction in whole or in part is permitted for any purpose of the United States Government. | ||||
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| Record Number: | CaltechAUTHORS:FRAsiamjam81 | ||||
| Persistent URL: | http://resolver.caltech.edu/CaltechAUTHORS:FRAsiamjam81 | ||||
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| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | ||||
| ID Code: | 12397 | ||||
| Collection: | CaltechAUTHORS | ||||
| Deposited By: | Archive Administrator | ||||
| Deposited On: | 24 Nov 2008 18:49 | ||||
| Last Modified: | 26 Dec 2012 10:31 |
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