Yang, X. and Yang, J. M. and Wang, X. Q. and Meng, E. and Tai, Y. C. and Ho, C. M. (1998) Micromachined membrane particle filters. In: International Workshop on Micro Electro Mechanical Systems,11th (MEMS 98), Heidelberg, Germany, 25-29 January 1998. IEEE , Piscataway, NJ, pp. 137-142. ISBN 0-7803-4412-X http://resolver.caltech.edu/CaltechAUTHORS:YANmems98
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We report here several particle membrane filters (8 x 8 mm^2) with circular, hexagonal and rectangular through holes. By varying hole dimensions from 6 to 12 pm, opening factors from 4 to 45 % are achieved. In order to improve the filter robustness, a composite silicon nitride/Parylene membrane technology is developed. More importantly, fluid dynamic performance of the filters is also studied by both experiments and numerical simulations. It is found that the gaseous flow through the filters depends strongly on opening factors, and the measured pressure drops are much lower than that from numerical simulation using the Navier-Stokes equation. Interestingly, surface velocity slip can only account for a minor part of the discrepancy. This suggests that a very interesting topic for micro fluid mechanics research is identified.
|Item Type:||Book Section|
|Additional Information:||© Copyright 1998 IEEE. Reprinted with permission. Meeting Date: 01/25/1998 - 01/29/1998. This work is supported by the DARPA MICRO-FLUMES program under Naval Ocean Systems Center Contract N66001-96-C-83632. The authors would like to thank Trevor Roper for help with processing.|
|Subject Keywords:||Navier-Stokes equations; elemental semiconductors; flow separation; fluid dynamics; membranes; micromechanical devices; numerical analysis; silicon; silicon compounds; filter robustness; fluid dynamic performance; gaseous flow; hole dimensions; micro fluid mechanics; micromachined membrane particle filters; numerical simulation; opening factors; pressure drops; silicon nitride/Parylene membrane; surface velocity slip|
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|Deposited By:||Kristin Buxton|
|Deposited On:||18 Dec 2008 05:26|
|Last Modified:||26 Dec 2012 10:37|
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