Schäfer, Sascha and Liang, Wenxi and Zewail, Ahmed H. (2010) Structural dynamics and transient electric-field effects in ultrafast electron diffraction from surfaces. Chemical Physics Letters, 493 (1-3). pp. 11-18. ISSN 0009-2614 http://resolver.caltech.edu/CaltechAUTHORS:20100629-165304691
- Published Version
Restricted to Repository administrators only
See Usage Policy.
Use this Persistent URL to link to this item: http://resolver.caltech.edu/CaltechAUTHORS:20100629-165304691
Ultrafast electron microscopy and diffraction provide direct visualization of structural dynamics with atomic scale resolution. In surface diffraction studies, it may have been assumed that the generation of transient electric fields could mask some features of structural dynamics. Here, we show that such an effect is irrelevant when ultrafast electron microscopy is invoked. It is also demonstrated that for the diffraction investigation of surfaces at grazing angles it is straightforward to observe the structural dynamics provided that simple controls are made for diffraction dependencies on order and intensity, and a comparison with the behavior of the undiffracted beam.
|Additional Information:||© 2010 Elsevier B.V. Received 12 April 2010; accepted 19 April 2010. Available online 27 April 2010. This work was supported by the National Science Foundation and the Air Force Office of Scientific Research in the Center for Physical Biology at Caltech supported by the Gordon and Betty Moore Foundation. One of the authors (S.S.) gratefully acknowledges a scholarship from the Alexander von Humboldt Foundation.|
|Usage Policy:||No commercial reproduction, distribution, display or performance rights in this work are provided.|
|Deposited By:||Jason Perez|
|Deposited On:||30 Jun 2010 20:20|
|Last Modified:||26 Dec 2012 12:11|
Repository Staff Only: item control page