Choi-Yim, H. and Busch, R. and Johnson, W. L. (1998) The effect of silicon on the glass forming ability of the Cu47Ti34Zr11Ni8 bulk metallic glass forming alloy during processing of composites. Journal of Applied Physics, 83 (12). pp. 7993-7997. ISSN 0021-8979 http://resolver.caltech.edu/CaltechAUTHORS:CHOjap98
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Composites of the Cu47Ti34Zr11Ni8 bulk metallic glass, reinforced with up to 30 vol % SiC particles are synthesized and characterized. Results based on x-ray diffraction, optical microscopy, scanning Auger microscopy, and differential scanning calorimetry (DSC) are presented. During processing of the composites, a TiC layer forms around the SiC particles and Si diffuses into the Cu47Ti34Zr11Ni8 matrix stabilizing the supercooled liquid against crystallization. The small Si addition between 0.5 and 1 at. % increases the attainable maximum thickness of glassy ingots from 4 mm for Cu–Ti–Zr–Ni alloys to 7 mm for Cu–Ti–Zr–Ni–Si alloys. DSC analyses show that neither the thermodynamics nor the kinetics of the alloy are affected significantly by the Si addition. This suggests that Si enhances the glass forming ability by chemically passivating impurities such as oxygen and carbon that cause heterogeneous nucleation in the melt.
|Additional Information:||©1998 American Institute of Physics. (Received 30 December 1997; accepted 11 March 1998) The authors would like to thank M. Tenhover for providing the scanning Auger microscope data. This work was jointly supported by U.S. Army Research Office, the Air Force Office of Scientific research under ARO Grant No. DAAH04-95-1-0233 and the U.S. Department of Energy (Grant No. DEFG-03-86ER45242).|
|Subject Keywords:||SILICON ADDITIONS; COPPER BASE ALLOYS; TITANIUM ALLOYS; ZIRCONIUM ALLOYS; NICKEL ALLOYS; METALLIC GLASSES; COMPOSITE MATERIALS; MATRIX MATERIALS; REINFORCED MATERIALS; SYNTHESIS; IMPURITIES; PASSIVATION; MECHANICAL PROPERTIES; copper alloys; silicon compounds; particle reinforced composites; X-ray diffraction; optical microscopy; thermal analysis; glass transition; Auger effect; scanning electron microscopy; materials preparation; supercooling|
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|Deposited On:||23 Feb 2006|
|Last Modified:||26 Dec 2012 08:46|
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