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Failures in power-combining arrays

Rutledge, David B. and Cheng, Nai-Shuo and York, Robert A. and Weikle, Robert M., II and De Lisio, Michael P. (1999) Failures in power-combining arrays. IEEE Transactions on Microwave Theory and Techniques, 47 (7, pt ). pp. 1077-1082. ISSN 0018-9480. http://resolver.caltech.edu/CaltechAUTHORS:RUTieeetmtt99

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Abstract

We derive a simple formula for the change in output when a device fails in a power-combining structure with identical matched devices. The loss is written in terms of the scattering coefficient of the failed device and reflection coefficient of an input port in the combining network. We apply this formula to several power combiners, including arrays in free space and enclosed waveguide structures. Our simulations indicate the output power degrades gracefully as devices fail, which is in agreement with previously published results.


Item Type:Article
Additional Information:© Copyright 1999 IEEE. Reprinted with permission. Manuscript received September 22, 1998. This work was supported by the U.S. Air Force Material Command/Rome Laboratory and by the Army Research Office under a Multidisciplinary University Research Initiative Grant to Caltech.
Subject Keywords:Graceful degradation, grid arrays, power combining, quasi-optics
Record Number:CaltechAUTHORS:RUTieeetmtt99
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:RUTieeetmtt99
Alternative URL:http://dx.doi.org/10.1109/22.775439
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:1956
Collection:CaltechAUTHORS
Deposited By: Archive Administrator
Deposited On:25 Feb 2006
Last Modified:26 Dec 2012 08:46

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