Two-level system noise reduction for Microwave Kinetic Inductance Detectors

Abstract

Noise performance is one of the most crucial aspects of any detector. Superconducting Microwave Kinetic Inductance Detectors (MKIDs) have an “excess” frequency noise that shows up as a small time dependent jitter of the resonance frequency characterized by the frequency noise power spectrum measured in units of Hz^2/Hz. Recent studies have shown that this noise almost certainly originates from a surface layer of two-level system (TLS) defects on the metallization or substrate. Fluctuation of these TLSs introduces noise in the resonator due to coupling of the TLS electric dipole moments to the resonator's electric field. Motivated by a semi-empirical quantitative theory of this noise mechanism, we have designed and tested new resonator geometries in which the high-field “capacitive” portion of the CPW resonator is replaced by an interdigitated capacitor (IDC) structure with 10–20 µm electrode spacing, as compared to the 2 µm spacing used for our more conventional CPW resonators. Measurements show that this new IDC design has dramatically lower TLS noise, currently by about a factor of ~29 in terms of the frequency noise power spectrum, corresponding to an improvement of about a factor of √(29) in NEP. These new devices are replacing the CPW resonators in our next design iteration in progress for MKIDCam. Opportunities and prospects for future reduction of the TLS noise will be discussed