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Growth of biaxially textured BaxPb1–xTiO3 ferroelectric thin films on amorphous Si3N4

Brewer, Rhett T. and Boyd, David A. and El-Naggar, Mohamed Y. and Boland, Stacey W. and Park, Young-Bae and Haile, Sossina M. and Goodwin, David G. and Atwater, Harry A. (2005) Growth of biaxially textured BaxPb1–xTiO3 ferroelectric thin films on amorphous Si3N4. Journal of Applied Physics, 97 (3). Art. No. 034103. ISSN 0021-8979. http://resolver.caltech.edu/CaltechAUTHORS:BREjap05

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Abstract

We prepared highly aligned, biaxially textured BaxPb1–xTiO3 (PBT) on amorphous Si3N4 by using an ion-beam-assisted deposited MgO as a template layer. PBT was deposited on a biaxially textured MgO using sol-gel synthesis, metal-organic chemical-vapor deposition, and molecular beam epitaxy. The biaxial texture of the PBT was inherited from the MgO template. The reflection high-energy electron diffraction (RHEED) and cross-section transmission electron microscopy (TEM) experiments suggest that exposure of the MgO template to atmospheric moisture before PBT heteroepitaxy resulted in a significant narrowing of the PBT in-plane orientation distribution. The microstructures of the biaxially textured PBT films were analyzed by x-ray diffraction, RHEED, and TEM. The dynamic contact mode electrostatic force microscopy polarization hysteresis loops confirmed that these films are ferroelectric.


Item Type:Article
Additional Information:©2004 American Institute of Physics (Received 8 March 2004; accepted 22 August 2004; published online 30 December 2004) The authors would like to thank D. G. Schlom for the helpful discussions about MBE and Carol Garland for the TEM assistance. One of the authors (Y.-B.P.) would like to acknowledge the support of the Postdoctoral Fellowship Program from Korea Science and Engineering Foundation (KOSEF). This work was supported by ARO MURI Grant No. DAAD19-01-1-0517. An additional support has been provided by the National Science Foundation, through the Caltech Center for the Science and Engineering of Materials.
Subject Keywords:barium compounds; lead compounds; ferroelectric thin films; ferroelectric materials; sol-gel processing; MOCVD; molecular beam epitaxial growth; dielectric polarisation; dielectric hysteresis; X-ray diffraction; transmission electron microscopy; reflection high energy electron diffraction
Record Number:CaltechAUTHORS:BREjap05
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:BREjap05
Alternative URL:http://dx.doi.org/10.1063/1.1806994
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:2053
Collection:CaltechAUTHORS
Deposited By: Archive Administrator
Deposited On:05 Mar 2006
Last Modified:26 Dec 2012 08:47

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