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Ferromagnetic resonance force microscopy on microscopic cobalt single layer films

Zhang, Z. and Hammel, P. C. and Midzor, M. and Roukes, M. L. and Childress, J. R. (1998) Ferromagnetic resonance force microscopy on microscopic cobalt single layer films. Applied Physics Letters, 73 (14). pp. 2036-2038. ISSN 0003-6951. http://resolver.caltech.edu/CaltechAUTHORS:ZHAapl98

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Abstract

We report mechanical detection of ferromagnetic resonance (FMR) signals from microscopic Co single layer thin films using a magnetic resonance force microscope (MRFM). Variations in the magnetic anisotropy field and the inhomogeneity of were clearly observed in the FMR spectra of microscopic Co thin films 500 and 1000 Å thick and ~ 40 × 200 µm^2 in lateral extent. This demonstrates the important potential that MRFM detection of FMR holds for microscopic characterization of spatial distribution of magnetic properties in magnetic layered materials and devices.


Item Type:Article
Additional Information:©1998 American Institute of Physics. (Received 24 February 1998; accepted 31 July 1998) The authors gratefully acknowledge fruitful discussions with Philip Wigen at Ohio State University and the support of the Center for Nonlinear Studies at Los Alamos National Laboratory. Work at Los Alamos was supported by the U.S. Department of Energy, Office of Basic Energy Sciences.
Subject Keywords:COBALT; THIN FILMS; FERROMAGNETIC RESONANCE; MICROSCOPY; MAGNETIC PROPERTIES; ANISOTROPY; POLYCRYSTALS; ferromagnetic materials; magnetic thin films; magnetic force microscopy; magnetic anisotropy
Record Number:CaltechAUTHORS:ZHAapl98
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:ZHAapl98
Alternative URL:http://dx.doi.org/10.1063/1.122359
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:2204
Collection:CaltechAUTHORS
Deposited By: Archive Administrator
Deposited On:15 Mar 2006
Last Modified:26 Dec 2012 08:48

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