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Lateral forces during atomic force microscopy of graphite in air

Baselt, David R. and Baldeschwieler, John D. (1992) Lateral forces during atomic force microscopy of graphite in air. Journal of Vacuum Science and Technology B, 10 (5). pp. 2316-2322. ISSN 1071-1023. http://resolver.caltech.edu/CaltechAUTHORS:BASjvstb92

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Abstract

Highly oriented pyrolytic graphite and boronated pyrolytic graphite were imaged in air by simultaneous normal and lateral force microscopy. A number of effects occurred when scanning over steps, including an increase in attractive forces from surface contamination which could be detrimental to the imaging of soft or weakly bonded samples. Contamination may also give rise to regions of high lateral force which do not seem to be associated with any topographic features. Finally, in atomic resolution images of graphite, atomic corrugation was clearer in the lateral cantilever deflection images than in the simultaneous topography and normal cantilever deflection images, demonstrating the high sensitivity of lateral force detection to topographic features.


Item Type:Article
Additional Information:© 1992 American Vacuum Society. (Received 4 February 1992; accepted 7 July 1992) The authors thank Topometrix for the use of their electronics and A. W. Moore for supplying the boronated graphite. This work was supported by a grant from Ford Motor Company and a fellowship from the National Science Foundation.
Subject Keywords:ATOMIC FORCE MICROSCOPY; GRAPHITE; PYROLYTIC CARBON; IMAGES; TOPOLOGY; DISTORTION
Record Number:CaltechAUTHORS:BASjvstb92
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:BASjvstb92
Alternative URL:http://dx.doi.org/10.1116/1.586061
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:2327
Collection:CaltechAUTHORS
Deposited By: Archive Administrator
Deposited On:27 Mar 2006
Last Modified:26 Dec 2012 08:48

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