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A greedy algorithm for tolerating defective crosspoints in nanoPLA design

Naeimi, Helia and DeHon, André (2004) A greedy algorithm for tolerating defective crosspoints in nanoPLA design. In: 2004 IEEE International Conference on Field-Programmable Technology. IEEE , Piscataway, NJ, pp. 49-56. ISBN 0-7803-8651-5 http://resolver.caltech.edu/CaltechAUTHORS:20110822-103525220

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Abstract

Recent developments suggest both plausible fabrication techniques and viable architectures for building sublithographic programmable logic arrays using molecular-scale wires and switches. Designs at this scale will see much higher defect rates than in conventional lithography. However, these defects need not be an impediment to programmable logic design as this scale. We introduce a strategy for tolerating defective crosspoints and develop a linear-time, greedy algorithm for mapping PLA logic around crosspoint defects. We note that P-term fanin must be bounded to guarantee low overhead mapping and develop analytical guidelines for bounding fanin. We further quantify analytical and empirical mapping overhead rates. Including fanin bounding, our greedy mapping algorithm maps a large set of benchmark designs with 13% average overhead for random junction defect rates as high as 20%.


Item Type:Book Section
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1109/FPT.2004.1393250 DOIUNSPECIFIED
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=1393250PublisherUNSPECIFIED
Additional Information:© 2004 IEEE. Issue Date: 6-8 Dec. 2004. Date of Current Version: 14 February 2005. This research was funded in part by the DARPA Moletronics program under grant ONR N00014-01-0651 and N00014-04-1-0591.
Funders:
Funding AgencyGrant Number
Defense Advanced Research Projects Agency (DARPA) Moletronics Program N00014-01-0651
Defense Advanced Research Projects Agency (DARPA) Moletronics Program N00014-04-1-0591
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INSPEC Accession Number8293014
Record Number:CaltechAUTHORS:20110822-103525220
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20110822-103525220
Official Citation:Naeimi, H.; DeHon, A.; , "A greedy algorithm for tolerating defective crosspoints in nanoPLA design," Field-Programmable Technology, 2004. Proceedings. 2004 IEEE International Conference on , vol., no., pp. 49- 56, 6-8 Dec. 2004 doi: 10.1109/FPT.2004.1393250 URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1393250&isnumber=30303
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:24973
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:22 Aug 2011 17:49
Last Modified:22 Aug 2011 17:49

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