A greedy algorithm for tolerating defective crosspoints in nanoPLA design

Abstract

Recent developments suggest both plausible fabrication techniques and viable architectures for building sublithographic programmable logic arrays using molecular-scale wires and switches. Designs at this scale will see much higher defect rates than in conventional lithography. However, these defects need not be an impediment to programmable logic design as this scale. We introduce a strategy for tolerating defective crosspoints and develop a linear-time, greedy algorithm for mapping PLA logic around crosspoint defects. We note that P-term fanin must be bounded to guarantee low overhead mapping and develop analytical guidelines for bounding fanin. We further quantify analytical and empirical mapping overhead rates. Including fanin bounding, our greedy mapping algorithm maps a large set of benchmark designs with 13% average overhead for random junction defect rates as high as 20%.