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Loss characterization in micro-cavities using the thermal bistability effect

Rokhsari, H. and Spillane, S. M. and Vahala, K. J. (2004) Loss characterization in micro-cavities using the thermal bistability effect. In: 2004 Digest of the LEOS Summer Topical Meetings. IEEE , Piscataway, NJ, pp. 52-53. ISBN 0-7803-8306-0 http://resolver.caltech.edu/CaltechAUTHORS:20110824-081843508

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Abstract

We investigate the role of absorption and scattering losses in limiting the quality factor of toroidal micro-cavities by monitoring the threshold power for thermal bistability in these structures.


Item Type:Book Section
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http://dx.doi.org/10.1109/LEOSST.2004.1338754 DOIUNSPECIFIED
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=1338754PublisherUNSPECIFIED
Additional Information:© 2004 IEEE. Issue Date: 28-30 July 2004. Date of Current Version: 08 October 2004.
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INSPEC Accession Number8221110
Record Number:CaltechAUTHORS:20110824-081843508
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20110824-081843508
Official Citation:Rokhsari, H.; Spillane, S.M.; Vahala, K.J.; , "Loss characterization in micro-cavities using the thermal bistability effect," Biophotonics/Optical Interconnects and VLSI Photonics/WBM Microcavities, 2004 Digest of the LEOS Summer Topical Meetings , vol., no., pp. 2 pp., 28-30 June 2004 doi: 10.1109/LEOSST.2004.1338754 URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1338754&isnumber=29519
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:25002
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:09 Sep 2011 22:26
Last Modified:09 Sep 2011 22:26

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