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Electrostatic Electron Microscopy. I

Bachman, C. H. and Ramo, Simon (1943) Electrostatic Electron Microscopy. I. Journal of Applied Physics, 14 (1). pp. 8-18. ISSN 0021-8979. http://resolver.caltech.edu/CaltechAUTHORS:BACjap43a

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Abstract

This paper, consisting of three parts, describes investigations made with the objective of developing a simplified, practical microscope of the type which yields magnified images of transparent specimens with a resolving power superior to that of the best light microscopes. The first part deals with the general problem of design, including the electron gun and the imaging lenses. A later part will describe a completed instrument embodying many of the results of the investigations.


Item Type:Article
Additional Information:© 1943 American Institute of Physics
Record Number:CaltechAUTHORS:BACjap43a
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:BACjap43a
Alternative URL:http://dx.doi.org/10.1063/1.1714924
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:2508
Collection:CaltechAUTHORS
Deposited By: Archive Administrator
Deposited On:06 Apr 2006
Last Modified:26 Dec 2012 08:49

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