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Electrostatic Electron Microscopy. II

Bachman, C. H. and Ramo, Simon (1943) Electrostatic Electron Microscopy. II. Journal of Applied Physics, 14 (2). pp. 69-77. ISSN 0021-8979. http://resolver.caltech.edu/CaltechAUTHORS:BACjap43b

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Abstract

This paper is a continuation of the description of problems arising in the development and design of an electrostatic electron microscope. The present article discusses depth of focus, lens and field stops, shielding, manufacturing tolerances, the choice of the number of stages of magnification, and alternative methods of viewing and recording the final image. A following paper will describe a completed instrument.


Item Type:Article
Additional Information:© 1943 American Institute of Physics
Record Number:CaltechAUTHORS:BACjap43b
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:BACjap43b
Alternative URL:http://dx.doi.org/10.1063/1.1714953
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:2509
Collection:CaltechAUTHORS
Deposited By: Archive Administrator
Deposited On:06 Apr 2006
Last Modified:26 Dec 2012 08:49

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