CaltechAUTHORS
  A Caltech Library Service

Electrostatic Electron Microscopy. III

Bachman, C. H. and Ramo, Simon (1943) Electrostatic Electron Microscopy. III. Journal of Applied Physics, 14 (4). pp. 155-160. ISSN 0021-8979. http://resolver.caltech.edu/CaltechAUTHORS:BACjap43c

[img]
Preview
PDF
See Usage Policy.

1075Kb

Use this Persistent URL to link to this item: http://resolver.caltech.edu/CaltechAUTHORS:BACjap43c

Abstract

This article, the final one of a series on the design of electrostatic electron microscopes, contains a description of an instrument which illustrates the principles previously discussed. The microscope described is believed to be the first constructed with the object of providing the greatest of simplicity in construction, operation, and maintenance with the design parameters balanced to give a particular range of resolving power. The range chosen is about ten times the light microscope. The instrument is permanently aligned and utilizes external photography. The over-all size and weight of the instrument, as well as the number and complexity of components, are materially less than previously described instruments.


Item Type:Article
Additional Information:© 1943 American Institute of Physics
Record Number:CaltechAUTHORS:BACjap43c
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:BACjap43c
Alternative URL:http://dx.doi.org/10.1063/1.1714968
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:2510
Collection:CaltechAUTHORS
Deposited By: Archive Administrator
Deposited On:06 Apr 2006
Last Modified:26 Dec 2012 08:49

Repository Staff Only: item control page