Yeh, N.-C. and Teague, M.-L. and Yeom, S. and Standley, B. L. and Wu, R. T.-P. and Boyd, D. A. and Bockrath, M. W. (2011) Strain-induced pseudo-magnetic fields and charging effects on CVD-grown graphene. Surface Science, 605 (17-18). pp. 1649-1656. ISSN 0039-6028 http://resolver.caltech.edu/CaltechAUTHORS:20110906-094009712
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Abstract
Atomically resolved imaging and spectroscopic characteristics of graphene grown by chemical vapor deposition (CVD) on copper are investigated by means of scanning tunneling microscopy and spectroscopy (STM/STS). For CVD-grown graphene remaining on the copper substrate, the monolayer carbon structures exhibit ripples and appear strongly strained, with different regions exhibiting different lattice structures and electronic density of states (DOS). In particular, ridges appear along the boundaries of different lattice structures, which exhibit excess charging effects. Additionally, the large and non-uniform strain induces pseudo-magnetic field up to ~ 50 T, as manifested by the DOS peaks at quantized energies that correspond to pseudo-magnetic field-induced integer and fractional Landau levels. In contrast, for graphene transferred from copper to SiO_2 substrates after the CVD growth, the average strain on the whole diminishes, so do the corresponding charging effects and pseudo-magnetic fields except for sample areas near topological defects. These findings suggest feasible nano-scale “strain engineering” of the electronic states of graphene by proper design of the substrates and growth conditions.
| Item Type: | Article | ||||||
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| Additional Information: | © 2011 Elsevier B.V. Available online 12 June 2011. This work was supported by NSF and NRI through the Center of Science and Engineering of Materials (CSEM) at Caltech. | ||||||
| Funders: |
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| Subject Keywords: | Scanning tunneling microscopy; Scanning tunneling spectroscopies; Chemical vapor deposition; Quantum effects; Surface structure; Morphology; Topography; Carbon | ||||||
| Record Number: | CaltechAUTHORS:20110906-094009712 | ||||||
| Persistent URL: | http://resolver.caltech.edu/CaltechAUTHORS:20110906-094009712 | ||||||
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| Official Citation: | N.-C. Yeh, M.-L. Teague, S. Yeom, B.L. Standley, R.T.-P. Wu, D.A. Boyd, M.W. Bockrath, Strain-induced pseudo-magnetic fields and charging effects on CVD-grown graphene, Surface Science, Volume 605, Issues 17-18, Graphene Surfaces and Interfaces, September 2011, Pages 1649-1656, ISSN 0039-6028, DOI: 10.1016/j.susc.2011.03.025. (http://www.sciencedirect.com/science/article/pii/S0039602811002275) | ||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | ||||||
| ID Code: | 25228 | ||||||
| Collection: | CaltechAUTHORS | ||||||
| Deposited By: | Ruth Sustaita | ||||||
| Deposited On: | 06 Sep 2011 17:00 | ||||||
| Last Modified: | 09 May 2012 17:02 |
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