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Improved Uniform Test Error Bounds

Bax, Eric (1997) Improved Uniform Test Error Bounds. California Institute of Technology . (Unpublished)

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We derive distribution-free uniform test error bounds that improve on VC-type bounds for validation. We show how to use knowledge of test inputs to improve the bounds. The bounds are sharp, but they require intense computation. We introduce a method to trade sharpness for speed of computation. Also, we compute the bounds for several test cases.

Item Type:Report or Paper (Technical Report)
Group:Computer Science Technical Reports
Record Number:CaltechCSTR:1997.cs-tr-97-15
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Usage Policy:You are granted permission for individual, educational, research and non-commercial reproduction, distribution, display and performance of this work in any format.
ID Code:26816
Deposited By: Imported from CaltechCSTR
Deposited On:25 Apr 2001
Last Modified:26 Dec 2012 14:06

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