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Improved Uniform Test Error Bounds

Bax, Eric (1997) Improved Uniform Test Error Bounds. California Institute of Technology , Pasadena, CA. (Unpublished) http://resolver.caltech.edu/CaltechCSTR:1997.cs-tr-97-15

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Use this Persistent URL to link to this item: http://resolver.caltech.edu/CaltechCSTR:1997.cs-tr-97-15

Abstract

We derive distribution-free uniform test error bounds that improve on VC-type bounds for validation. We show how to use knowledge of test inputs to improve the bounds. The bounds are sharp, but they require intense computation. We introduce a method to trade sharpness for speed of computation. Also, we compute the bounds for several test cases.


Item Type:Report or Paper (Technical Report)
Additional Information:© 1997 California Institute of Technology. I thank Dr Joel Franklin for his teaching advice and encouragement I thank Zehra Cataltepe, Sam Roweis, and Joe Sill for their many helpful conversations and pointers to literature in the development of this work. Also thanks to Dr. Yaser Abu-Mostafa for his informative and inspiring teaching.
Group:Computer Science Technical Reports
Subject Keywords:machine learning learning theory generalization Vapnik-Chervonenkis
DOI:10.7907/Z9959FK4
Record Number:CaltechCSTR:1997.cs-tr-97-15
Persistent URL:http://resolver.caltech.edu/CaltechCSTR:1997.cs-tr-97-15
Usage Policy:You are granted permission for individual, educational, research and non-commercial reproduction, distribution, display and performance of this work in any format.
ID Code:26816
Collection:CaltechCSTR
Deposited By: Imported from CaltechCSTR
Deposited On:25 Apr 2001
Last Modified:27 Mar 2017 16:00

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