Bax, Eric (1997) Improved Uniform Test Error Bounds. California Institute of Technology . (Unpublished) http://resolver.caltech.edu/CaltechCSTR:1997.cs-tr-97-15
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Abstract
We derive distribution-free uniform test error bounds that improve on VC-type bounds for validation. We show how to use knowledge of test inputs to improve the bounds. The bounds are sharp, but they require intense computation. We introduce a method to trade sharpness for speed of computation. Also, we compute the bounds for several test cases.
| Item Type: | Report or Paper (Technical Report) |
|---|---|
| Group: | Computer Science Technical Reports |
| Record Number: | CaltechCSTR:1997.cs-tr-97-15 |
| Persistent URL: | http://resolver.caltech.edu/CaltechCSTR:1997.cs-tr-97-15 |
| Usage Policy: | You are granted permission for individual, educational, research and non-commercial reproduction, distribution, display and performance of this work in any format. |
| ID Code: | 26816 |
| Collection: | CaltechCSTR |
| Deposited By: | Imported from CaltechCSTR |
| Deposited On: | 25 Apr 2001 |
| Last Modified: | 26 Dec 2012 14:06 |
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