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Techniques for Testing Integrated Circuits

DeBenedictis, Erik P. (1983) Techniques for Testing Integrated Circuits. California Institute of Technology . (Unpublished) http://resolver.caltech.edu/CaltechCSTR:1982.4777-tr-82

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Use this Persistent URL to link to this item: http://resolver.caltech.edu/CaltechCSTR:1982.4777-tr-82

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Item Type:Report or Paper (Technical Report)
Group:Computer Science Technical Reports
Record Number:CaltechCSTR:1982.4777-tr-82
Persistent URL:http://resolver.caltech.edu/CaltechCSTR:1982.4777-tr-82
Usage Policy:You are granted permission for individual, educational, research and non-commercial reproduction, distribution, display and performance of this work in any format.
ID Code:27059
Collection:CaltechCSTR
Deposited By: Imported from CaltechCSTR
Deposited On:02 Jan 2003
Last Modified:26 Dec 2012 14:13

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