Drakopoulos, Michael and Snigirev, Anatoly and Snigireva, Irina and Schilling, Jörg (2005) X-ray high-resolution diffraction using refractive lenses. Applied Physics Letters, 86 (1). Art. No. 014102. ISSN 0003-6951 http://resolver.caltech.edu/CaltechAUTHORS:DRAapl05
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Abstract
Refractive x-ray lenses have recently been applied for imaging and scanning microscopy with hard x rays. We report the application of refractive lenses in an optical scheme for high-resolution x-ray diffraction, performed at a high brilliance synchrotron radiation source. An experimental proof of principle and a theoretical discussion are presented. In particular, we observe the x-ray diffraction pattern from a two-dimensional photonic crystal with 4.2 µm periodicity, which normally is employed to scatter light in the infrared.
| Item Type: | Article |
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| Additional Information: | ©2005 American Institute of Physics (Received 21 July 2004; accepted 1 November 2004; published online 23 December 2004) The authors would like to thank R. Rueffer, A. Chumakov, O. Leupold, and J.-P. Celse from beamline ID18 for their excellent support. As well, they appreciate Viktor Kohn’s critical remarks during the preparation of the manuscript. |
| Subject Keywords: | X-ray diffraction; lenses; X-ray optics; synchrotron radiation; photonic crystals |
| Record Number: | CaltechAUTHORS:DRAapl05 |
| Persistent URL: | http://resolver.caltech.edu/CaltechAUTHORS:DRAapl05 |
| Alternative URL: | http://dx.doi.org/10.1063/1.1843282 |
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. |
| ID Code: | 2725 |
| Collection: | CaltechAUTHORS |
| Deposited By: | Archive Administrator |
| Deposited On: | 24 Apr 2006 |
| Last Modified: | 26 Dec 2012 08:50 |
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