Drakopoulos, Michael and Snigirev, Anatoly and Snigireva, Irina and Schilling, Jörg (2005) X-ray high-resolution diffraction using refractive lenses. Applied Physics Letters, 86 (1). Art. No. 014102. ISSN 0003-6951 http://resolver.caltech.edu/CaltechAUTHORS:DRAapl05
See Usage Policy.
Use this Persistent URL to link to this item: http://resolver.caltech.edu/CaltechAUTHORS:DRAapl05
Refractive x-ray lenses have recently been applied for imaging and scanning microscopy with hard x rays. We report the application of refractive lenses in an optical scheme for high-resolution x-ray diffraction, performed at a high brilliance synchrotron radiation source. An experimental proof of principle and a theoretical discussion are presented. In particular, we observe the x-ray diffraction pattern from a two-dimensional photonic crystal with 4.2 µm periodicity, which normally is employed to scatter light in the infrared.
|Additional Information:||©2005 American Institute of Physics (Received 21 July 2004; accepted 1 November 2004; published online 23 December 2004) The authors would like to thank R. Rueffer, A. Chumakov, O. Leupold, and J.-P. Celse from beamline ID18 for their excellent support. As well, they appreciate Viktor Kohn’s critical remarks during the preparation of the manuscript.|
|Subject Keywords:||X-ray diffraction; lenses; X-ray optics; synchrotron radiation; photonic crystals|
|Usage Policy:||No commercial reproduction, distribution, display or performance rights in this work are provided.|
|Deposited By:||Archive Administrator|
|Deposited On:||24 Apr 2006|
|Last Modified:||26 Dec 2012 08:50|
Repository Staff Only: item control page