Huang, X. M. H. and Zorman, C. A. and Mehregany, M. and Roukes, M. L. (2003) Quality factor issues in silicon carbide nanomechanical resonators. In: Transducers '03: the 12th International Conference on Solid-State Sensors, Actuators and Microsystems. IEEE , Piscataway, N.J., pp. 722-725. ISBN 0-7803-7731-1 http://resolver.caltech.edu/CaltechAUTHORS:20111028-135927801
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Nanomechanical resonators with fundamental mode resonance frequencies in the Very-High Frequency (VHF), Ultra-High Frequency (UHF) range and microwave L-band are fabricated from monocrystalline silicon carbide thin film material, and measured by magnetomotive transduction, combined with a balanced bridge read out circuit. For resonators made from the same film, we measured the frequency (i.e., geometry) dependence of the quality factor. It is found that the quality factor of these resonators decreases when the frequency increases. This indicates the importance of clamping loss in this regime. In addition, from studies of resonators made from different chips with varying surface roughness, we found a strong correlation between surface roughness of the silicon carbide thin film material and the quality factor of the resonators made from it. Understanding the dissipation mechanisms, and thus improving the quality factor of these resonators, is important for implementing applications promised by these devices.
|Item Type:||Book Section|
|Additional Information:||© 2003 IEEE. Issue Date: 8-12 June 2003. Date of Current Version: 28 July 2003. This work was generously supported by DARPA MTO/MEMS and NSF.|
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|Official Citation:||Huang, X.M.H.; Zorman, C.A.; Mehregany, M.; Roukes, M.L.; , "Quality factor issues in silicon carbide nanomechanical resonators," TRANSDUCERS, Solid-State Sensors, Actuators and Microsystems, 12th International Conference on, 2003 , vol.1, no., pp. 722- 725 vol.1, 8-12 June 2003 doi: 10.1109/SENSOR.2003.1215575 URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1215575&isnumber=27333|
|Usage Policy:||No commercial reproduction, distribution, display or performance rights in this work are provided.|
|Deposited By:||Ruth Sustaita|
|Deposited On:||28 Oct 2011 21:21|
|Last Modified:||28 Oct 2011 21:21|
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