Black, Eric D. and Grudinin, Ivan S. and Rao, Shanti R. and Libbrecht, Kenneth G. (2004) Enhanced photothermal displacement spectroscopy for thin-film characterization using a Fabry-Perot resonator. Journal of Applied Physics, 95 (12). pp. 7655-7659. ISSN 0021-8979. http://resolver.caltech.edu/CaltechAUTHORS:BLAjap04
See Usage Policy.
Use this Persistent URL to link to this item: http://resolver.caltech.edu/CaltechAUTHORS:BLAjap04
We have developed a technique for photothermal displacement spectroscopy that is potentially orders of magnitude more sensitive than conventional methods. We use a single Fabry-Perot resonator to enhance both the intensity of the pump beam and the sensitivity of the probe beam. The result is an enhancement of the response of the instrument by a factor proportional to the square of the finesse of the cavity over conventional interferometric measurements. In this paper we present a description of the technique, and we discuss how the properties of thin films can be deduced from the photothermal response. As an example of the technique, we report a measurement of the thermal properties of a multilayer dielectric mirror similar to those used in interferometric gravitational wave detectors.
|Additional Information:||©2004 American Institute of Physics. (Received 23 October 2003; accepted 5 March 2004) Many thanks to Alan Weinstein for carefully reading this manuscript and for providing many helpful suggestions. This work was supported by the NSF under Grant No. PHY98-01158.|
|Subject Keywords:||silicon compounds; titanium compounds; dielectric thin films; thermal expansion; thermal conductivity; Fabry-Perot resonators; Fabry-Perot interferometers; photothermal spectroscopy|
|Usage Policy:||No commercial reproduction, distribution, display or performance rights in this work are provided.|
|Deposited By:||Archive Administrator|
|Deposited On:||26 Apr 2006|
|Last Modified:||26 Dec 2012 08:50|
Repository Staff Only: item control page