Vayonakis, A. and Luo, C. and LeDuc, H. G. and Schoelkopf, R. and Zmuidzinas, J. (2002) The millimeter-wave properties of superconducting microstrip lines. In: Low Temperature Detectors. AIP Conference Series (605). American Institute of Physics , Melville, NY, pp. 539-542. ISBN 0-7354-0049-0 http://resolver.caltech.edu/CaltechAUTHORS:20111109-095848834
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We have developed a novel technique for making high quality measurements of the millimeter-wave properties of superconducting thin-film microstrip transmission lines. Our experimental technique currently covers the 75-100 GHz band. The method is based on standing wave resonances in an open ended transmission line. We obtain information on the phase velocity and loss of the microstrip. Our data for Nb/SiO/Nb lines, taken at 4.2 K and 1.6 K, can be explained by a single set of physical parameters. Our preliminary conclusion is that the loss is dominated by the SiO dielectric, with a temperature-independent loss tangent of 5.3 ± 0.5 x 10^(-3) for our samples.
|Item Type:||Book Section|
|Additional Information:||© 2002 American Institute of Physics. Issue Date: 5 February 2002.|
|Subject Keywords:||microstrip lines, superconducting microwave devices, millimetre wave devices; millimetre wave propagation; velocity measurement; frequency response; losses; low-temperature techniques|
|Classification Code:||PACS: 85.25.Qc|
|Official Citation:||The millimeter-wave properties of superconducting microstrip lines A. Vayonakis, C. Luo, H. G. Leduc, R. Schoelkopf, and J. Zmuidzinas, AIP Conf. Proc. 605, 539 (2002), DOI:10.1063/1.1457704|
|Usage Policy:||No commercial reproduction, distribution, display or performance rights in this work are provided.|
|Deposited By:||Jason Perez|
|Deposited On:||09 Nov 2011 19:52|
|Last Modified:||26 Dec 2012 14:23|
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