O'Connor, S. D. and Gamble, R. C. and Eby, R. K. and Baldeschwieler, J. D. (1996) Gamble mode: Resonance contact mode in atomic force microscopy. Journal of Vacuum Science and Technology B, 14 (2). pp. 852-855. ISSN 1071-1023 http://resolver.caltech.edu/CaltechAUTHORS:OCOjvstb96
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Active noise reduction has been accomplished in atomic force microscopy by applying a high frequency, low amplitude vibration to the cantilever while it is in contact with a surface. The applied excitation (>~ 200 kHz; ~ 1 nm) is acoustically coupled to the tip and dampens the resonance Q factors of the system. The applied frequency is well above the bandwidth of the acquisition system (50 kHz). We call this mode "gamble mode" or "resonance contact."
|Additional Information:||©1996 American Vacuum Society (Received 25 July 1995; accepted 25 January 1996) S. D. O’Connor is supported by a NIH traineeship. The CIT authors thank Topometrix for the installation and maintenance of the Discoverer SPM system located in their laboratory.|
|Subject Keywords:||PROBES; MECHANICAL VIBRATIONS; KHZ RANGE; SIGNAL – TO – NOISE RATIO; RESONANCE; IMAGE FORMING|
|Usage Policy:||No commercial reproduction, distribution, display or performance rights in this work are provided.|
|Deposited By:||Archive Administrator|
|Deposited On:||27 Apr 2006|
|Last Modified:||26 Dec 2012 08:51|
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