O'Connor, S. D. and Gamble, R. C. and Eby, R. K. and Baldeschwieler, J. D. (1996) Gamble mode: Resonance contact mode in atomic force microscopy. Journal of Vacuum Science and Technology B, 14 (2). pp. 852-855. ISSN 1071-1023 http://resolver.caltech.edu/CaltechAUTHORS:OCOjvstb96
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Abstract
Active noise reduction has been accomplished in atomic force microscopy by applying a high frequency, low amplitude vibration to the cantilever while it is in contact with a surface. The applied excitation (>~ 200 kHz; ~ 1 nm) is acoustically coupled to the tip and dampens the resonance Q factors of the system. The applied frequency is well above the bandwidth of the acquisition system (50 kHz). We call this mode "gamble mode" or "resonance contact."
| Item Type: | Article |
|---|---|
| Additional Information: | ©1996 American Vacuum Society (Received 25 July 1995; accepted 25 January 1996) S. D. O’Connor is supported by a NIH traineeship. The CIT authors thank Topometrix for the installation and maintenance of the Discoverer SPM system located in their laboratory. |
| Subject Keywords: | PROBES; MECHANICAL VIBRATIONS; KHZ RANGE; SIGNAL – TO – NOISE RATIO; RESONANCE; IMAGE FORMING |
| Record Number: | CaltechAUTHORS:OCOjvstb96 |
| Persistent URL: | http://resolver.caltech.edu/CaltechAUTHORS:OCOjvstb96 |
| Alternative URL: | http://dx.doi.org/10.1116/1.588729 |
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. |
| ID Code: | 2786 |
| Collection: | CaltechAUTHORS |
| Deposited By: | Archive Administrator |
| Deposited On: | 27 Apr 2006 |
| Last Modified: | 26 Dec 2012 08:51 |
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