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Gamble mode: Resonance contact mode in atomic force microscopy

O'Connor, S. D. and Gamble, R. C. and Eby, R. K. and Baldeschwieler, J. D. (1996) Gamble mode: Resonance contact mode in atomic force microscopy. Journal of Vacuum Science and Technology B, 14 (2). pp. 852-855. ISSN 1071-1023. http://resolver.caltech.edu/CaltechAUTHORS:OCOjvstb96

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Abstract

Active noise reduction has been accomplished in atomic force microscopy by applying a high frequency, low amplitude vibration to the cantilever while it is in contact with a surface. The applied excitation (>~ 200 kHz; ~ 1 nm) is acoustically coupled to the tip and dampens the resonance Q factors of the system. The applied frequency is well above the bandwidth of the acquisition system (50 kHz). We call this mode "gamble mode" or "resonance contact."


Item Type:Article
Additional Information:©1996 American Vacuum Society (Received 25 July 1995; accepted 25 January 1996) S. D. O’Connor is supported by a NIH traineeship. The CIT authors thank Topometrix for the installation and maintenance of the Discoverer SPM system located in their laboratory.
Subject Keywords:PROBES; MECHANICAL VIBRATIONS; KHZ RANGE; SIGNAL – TO – NOISE RATIO; RESONANCE; IMAGE FORMING
Record Number:CaltechAUTHORS:OCOjvstb96
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:OCOjvstb96
Alternative URL:http://dx.doi.org/10.1116/1.588729
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:2786
Collection:CaltechAUTHORS
Deposited By: Archive Administrator
Deposited On:27 Apr 2006
Last Modified:26 Dec 2012 08:51

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