Anderson, Dana Z. and Frisch, Josef C. and Masser, Carl S. (1984) Mirror reflectometer based on optical cavity decay time. Applied Optics, 23 (8). pp. 1238-1245. ISSN 0003-6935. http://resolver.caltech.edu/CaltechAUTHORS:ANDao84b
See Usage Policy.
Use this Persistent URL to link to this item: http://resolver.caltech.edu/CaltechAUTHORS:ANDao84b
Described is a reflectometer capable of making reflectivity measurements of low-loss highly reflecting mirror coatings and transmission measurements of low-loss antireflection coatings. The technique directly measures the intensity decay time of an optical cavity comprised of low-loss elements. We develop the theoretical framework for the device and discuss in what conditions and to what extent the decay time represents a true measure of mirror reflectivity. Current apparatus provides a decay time resolution of 10 nsec and has demonstrated a cavity total loss resolution of 5 ppm.
|Additional Information:||© 1984 Optical Society of America. Received 13 January 1983. We owe special thanks to R. W. P. Drever for his encouragement and insight. We would also like to thank R. E. Spero, S. E. Whitcomb, and M. Hereld for valuable advice and assitance. We are indebted to T. Hutchings and S. W. Hammons of Litton Industries, Guidance & Control Systems Division, for providing us with the low-loss (180-ppm) mirror coatings and to S. S. M. Lu and R. Hargrove of Litton for the production of the coatings. The work of D. Z. Anderson was supported by NSF grant PHY82 04056.|
|Usage Policy:||No commercial reproduction, distribution, display or performance rights in this work are provided.|
|Deposited By:||Archive Administrator|
|Deposited On:||03 May 2006|
|Last Modified:||26 Dec 2012 08:51|
Repository Staff Only: item control page