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Probabilistic affine invariants for recognition

Leung, Thomas K. and Burl, Michael C. and Perona, Pietro (1998) Probabilistic affine invariants for recognition. In: 1998 IEEE Computer Society Conference on Computer Vision and Pattern Recognition. IEEE Computer Society , Los Alamitos, CA, pp. 678-684. ISBN 0-8186-8497-6 http://resolver.caltech.edu/CaltechAUTHORS:20111222-145123625

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Abstract

Under a weak perspective camera model, the image plane coordinates in different views of a planar object are related by an affine transformation. Because of this property, researchers have attempted to use affine invariants for recognition. However, there are two problems with this approach: (1) objects or object classes with inherent variability cannot be adequately treated using invariants; and (2) in practice the calculated affine invariants can be quite sensitive to errors in the image plane measurements. In this paper we use probability distributions to address both of these difficulties. Under the assumption that the feature positions of a planar object can be modeled using a jointly Gaussian density, we have derived the joint density over the corresponding set of affine coordinates. Even when the assumptions of a planar object and a weak perspective camera model do not strictly hold, the results are useful because deviations from the ideal can be treated as deformability in the underlying object model.


Item Type:Book Section
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1109/CVPR.1998.698677 DOIUNSPECIFIED
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=698677PublisherUNSPECIFIED
Additional Information:© 1998 IEEE. Date of Current Version: 06 August 2002. This work is supported by the NSF engineering research center for neuromorphic systems engineering at Caltech, a National Young Investigator Award to PP and a Berkeley Fellowship to TKL.
Funders:
Funding AgencyGrant Number
NSF Engineering Research Center for Neuromorphic Systems Engineering (CNSE)UNSPECIFIED
NSF National Young Investigator Award UNSPECIFIED
Berkeley Fellowship UNSPECIFIED
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INSPEC Accession Number5985913
Record Number:CaltechAUTHORS:20111222-145123625
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20111222-145123625
Official Citation:Leung, T.K.; Burl, M.C.; Perona, P.; , "Probabilistic affine invariants for recognition," Computer Vision and Pattern Recognition, 1998. Proceedings. 1998 IEEE Computer Society Conference on , vol., no., pp.678-684, 23-25 Jun 1998 doi: 10.1109/CVPR.1998.698677 URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=698677&isnumber=15135
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:28576
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:22 Dec 2011 23:57
Last Modified:22 Dec 2011 23:57

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