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Fabrication-tolerant high quality factor photonic crystal microcavities

Srinivasan, Kartik and Barclay, Paul E. and Painter, Oskar (2004) Fabrication-tolerant high quality factor photonic crystal microcavities. Optics Express, 12 (7). pp. 1458-1463. ISSN 1094-4087. http://resolver.caltech.edu/CaltechAUTHORS:SRIoe04

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Abstract

A two-dimensional photonic crystal microcavity design supporting a wavelength-scale volume resonant mode with a calculated quality factor (Q) insensitive to deviations in the cavity geometry at the level of Q 2×10^4 is presented. The robustness of the cavity design is confirmed by optical fiberbased measurements of passive cavities fabricated in silicon. For microcavities operating in the λ = 1500 nm wavelength band, quality factors between 1.3-4.0×10^4 are measured for significant variations in cavity geometry and for resonant mode normalized frequencies shifted by as much as 10% of the nominal value.


Item Type:Article
Additional Information:Copyright: © 2004 Optical Society of America. Received 2 March 2004; revised 30 March 2004; accepted 31 March 2004. This work was partly supported by the Charles Lee Powell Foundation. The authors thank M. Borselli for his contributions in building the taper test setup. K.S. thanks the Hertz Foundation for its financial support.
Subject Keywords:OCIS codes: (230.5750) Resonators; (140.5960) Semiconductor lasers
Record Number:CaltechAUTHORS:SRIoe04
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:SRIoe04
Alternative URL:http://www.opticsexpress.org/abstract.cfm?URI=OPEX-12-7-1458
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:294
Collection:CaltechAUTHORS
Deposited By: Archive Administrator
Deposited On:18 May 2005
Last Modified:26 Dec 2012 08:39

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