Prasad, J. K. and Rasheed, A. and Kumar, S. and Sturtevant, B. (2000) The late-time development of the Richtmyer–Meshkov instability. Physics of Fluids, 12 (8). pp. 2108-2115. ISSN 1070-6631 http://resolver.caltech.edu/CaltechAUTHORS:PRApof00
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Measurements have been made of the growth by the Richtmyer–Meshkov instability of nominally single-scale perturbations on an air/sulfur hexafluoride (SF6) interface in a large shock tube. An approximately sinusoidal shape is given to the interface by a wire mesh which supports a polymeric membrane separating the air from the SF6. A single shock wave incident on the interface induces motion by the baroclinic mechanism of vorticity generation. The visual thickness delta of the interface is measured from schlieren photographs obtained singly in each run and in high-speed motion pictures. Data are presented for delta at times considerably larger than previously reported, and they are tested for self-similarity including independence of initial conditions. Four different initial amplitude/wavelength combinations at one incident shock strength are used to determine the scaling of the data. It is found that the growth rate decreases rapidly with time, ddelta/dt[proportional]t–p (i.e., delta[proportional]t1–p), where 0.67<~p<~0.74 and that a small dependence on the initial wavelength lambda0 persists to large time. The larger value of the power law exponent agrees with the result of the late-time-decay similarity law of Huang and Leonard [Phys. Fluids 6, 3765–3775 (1994)]. The influence of the wire mesh and membrane on the mixing process is assessed.
|Additional Information:||©2000 American Institute of Physics. (Received 20 May 1999; accepted 3 April 2000) This work was supported by Contract B160540, Lawrence Livermore National Laboratory.|
|Subject Keywords:||PERTURBATION THEORY; SHOCK WAVES; FLUIDS; FLUID MECHANICS; MIXING; SCHLIEREN METHOD; PHOTOGRAPHY; THICKNESS; INTERFACES; SHOCK TUBES; SULFUR FLUORIDES; INSTABILITY; INSTABILITY GROWTH RATES; flow instability; shock wave effects; schlieren systems; photographic applications|
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|Deposited By:||Archive Administrator|
|Deposited On:||12 May 2006|
|Last Modified:||26 Dec 2012 08:52|
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