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Measurement of Young's modulus on microfabricated structures using a surface profiler

Tai, Yu-Chong and Muller, Richard S. (1990) Measurement of Young's modulus on microfabricated structures using a surface profiler. In: 1990 Proceedings on Micro electro mechanical systems: an investigation of micro structures, sensors, actuators, machines, and robots. IEEE , New York, NY, pp. 147-152. ISBN 756578224 http://resolver.caltech.edu/CaltechAUTHORS:20120509-154113327

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Abstract

A point-force, load-deflection method using a stylus-type surface profiler to determine the Young's moduli (E_Y) of thin-film microstructural materials is introduced. In this method both force and deflection in microstructures are measured simultaneously by the profiler to provide a convenient and accurate means to obtain Young's modulus directly. Measurements on two types of micromechanical structures are described: a doubly supported bridge and a bridge-slider (a beam with one fixed end and one end that can slide in a flanged housing). The influence of residual stress in the doubly supported beam is described and accounted for theoretically to interpret measurements made on low-stress silicon-nitride films. For this material E_Y is 373 GPa. In the bridge-slider structure, residual strain is relaxed to zero. Measurements on a polycrystalline-silicon bridge slider show a value for E_Y of 123 GPa in unannealed material that is doped heavily with phosphorous, and grown at 650°C.


Item Type:Book Section
Related URLs:
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http://dx.doi.org/10.1109/MEMSYS.1990.110267DOIUNSPECIFIED
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=110267PublisherUNSPECIFIED
Additional Information:© 1990 IEEE. Date of Current Version: 06 August 2002. We thank M. Lim and W. Tang for their help with SUPERSAP simulations. We also thank K. Voros, R. Hamilton, and the staff of the Berkeley Microfabrication Laboratory for assistance in processing.
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INSPEC Accession Number3764183
Record Number:CaltechAUTHORS:20120509-154113327
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20120509-154113327
Official Citation:Tai, Y.-C.; Muller, R.S.; , "Measurement of Young's modulus on microfabricated structures using a surface profiler," Micro Electro Mechanical Systems, 1990. Proceedings, An Investigation of Micro Structures, Sensors, Actuators, Machines and Robots. IEEE , vol., no., pp.147-152, 11-14 Feb 1990 doi: 10.1109/MEMSYS.1990.110267 URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=110267&isnumber=3338
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:31396
Collection:CaltechAUTHORS
Deposited By: Ruth Sustaita
Deposited On:10 May 2012 15:48
Last Modified:26 Dec 2012 15:11

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