Dovek, Moris M. and Heben, Michael J. and Lang, Christop A. and Lewis, Nathan S. and Quate, Calvin F. (1988) Design of a scanning tunneling microscope for electrochemical applications. Review of Scientific Instruments, 59 (11). pp. 2333-2336. ISSN 0034-6748 http://resolver.caltech.edu/CaltechAUTHORS:20120601-105338500
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A design for a scanning tunneling microscope that is well suited for electrochemical investigations is presented. The construction of the microscope ensures that only the tunneling tip and the sample participate in electrochemical reactions. The design also allows rapid replacement of the tip or sample, and enables facile introduction of auxiliary electrodes for use in electrochemical experiments. The microscope utilizes stepper motor driven approach mechanics in order to achieve fully remote operation and to allow reproducible coarse control of tip/sample spacings for electrochemical experiments. Highly ordered pyrolytic graphite images at atomic resolution in air and aqueous solutions can be obtained with this microscope.
|Additional Information:||© 1988 American Institute of Physics. Received 9 May 1988; accepted 18 July 1988. The authors would like to thank Alison Baski, Jun Nogami, and Reggie Penner for useful discussions and help with construction of the microscope. We acknowledge the support of an IBM Predoctoral Manufacturing Fellowship (M. M.D.) and a German National Scholarship Foundation Overseas Fellowship (C. A. L.). N. S. L. acknowledges support as a Dreyfus Teacher-Scholar and as an A. P. Sloan Fellow. N. S. L. also acknowledges financial assistance from the Office of Naval Research, Grant No. N00014-85-K-0805. C. F. Q. acknowledges support of the Defense Advanced Research Projects Agency.|
|Subject Keywords:||ELECTRON MICROSCOPES, DESIGN, ELECTROCHEMISTRY, SCANNING ELECTRON MICROSCOPY, ELECTRON TUNNELING SPECTROSCOPY, OPERATION, SAMPLE HOLDERS, RESOLUTION, GRAPHITE, SURFACE ANALYSIS|
|Classification Code:||PACS: 07.78.+s, 82.80.Yc|
|Official Citation:||Design of a scanning tunneling microscope for electrochemical applications Moris M. Dovek, Michael J. Heben, Christoph A. Lang, Nathan S. Lewis, and Calvin F. Quate Rev. Sci. Instrum. 59, 2333 (1988); http://dx.doi.org/10.1063/1.1139957|
|Usage Policy:||No commercial reproduction, distribution, display or performance rights in this work are provided.|
|Deposited By:||Ruth Sustaita|
|Deposited On:||01 Jun 2012 18:16|
|Last Modified:||26 Dec 2012 15:17|
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