Miles, R. H. and McGill, T. C. and Sivananthan, S. and Chu, X. and Faurie, J. P. (1987) Structure of CdTe/ZnTe superlattices. Journal of Vacuum Science and Technology B, 5 (4). pp. 1263-1267. ISSN 1071-1023 http://resolver.caltech.edu/CaltechAUTHORS:20120625-142036609
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The structure of CdTe/ZnTe superlattices has been analyzed through θ/2θ x‐ray diffraction, photoluminescence, and in situ reflection high‐energy electron diffraction (RHEED) measurements. Samples are found to break away from Cd_(x)Zn_(1−x)Te buffer layers as a consequence of the 6% lattice mismatch in this system. However, defect densities in these superlattices are seen to drop dramatically away from the buffer layer interface, accounting for the intense photoluminescence and high‐average strain fields seen in each of our samples. Observed variations in residual strains suggest that growth conditions play a role in forming misfit defects. This could explain discrepancies with calculated values of critical thickness based on models which neglect growth conditions. Photoluminescence spectra reveal that layer‐to‐layer growth proceeded with single monolayer uniformity, suggesting highly reproducible growth. Our results give hope for relatively defect‐free Cd_(x)Zn_(1−x)Te/Cd_(y)Zn_(1−y)Te superlattices with the potential for applications to optoelectronics offered by intense visible light emitters.
|Additional Information:||© 1987 American Vacuum Society. Received 20 March 1987; Accepted 15 April 1987. One of us (RHM) is grateful to IBM for financial support. We have benefitted from several valuable discussions with M. B. Johnson and P.M. Petroff. We also wish to acknowledge the technical assistance of S. Anlage and C.-R. Wie. Work at the University of Illinois was supported by the Defense Advanced Research Projects Agency under Contract No. MDA 903-83-K-025. The authors wish to acknowledge the partial support of DARPA/ONR under Contract No. N00014-86-K-0841.|
|Subject Keywords:||SUPERLATTICES; CADMIUM TELLURIDES; ZINC TELLURIDES, PHOTOLUMINESCENCE; RHEED; X−RAY DIFFRACTION; STRAINS; CRYSTAL DEFECTS; INTERFACE STRUCTURE; CRYSTAL STRUCTURE; STRAINS; FILM GROWTH; FABRICATION; MOLECULAR BEAM EPITAXY|
|Classification Code:||PACS: 68.65.-k|
|Official Citation:||Structure of CdTe/ZnTe superlattices R. H. Miles, T. C. McGill, S. Sivananthan, X. Chu, and J. P. Faurie, J. Vac. Sci. Technol. B 5, 1263 (1987), DOI:10.1116/1.583816|
|Usage Policy:||No commercial reproduction, distribution, display or performance rights in this work are provided.|
|Deposited By:||Jason Perez|
|Deposited On:||27 Jun 2012 20:50|
|Last Modified:||26 Dec 2012 15:23|
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