Boland, John J. and Halaka, Folim G. and Baldeschwieler, John D. (1983) Data analysis in extended x-ray-absorption fine structure: Determination of the background absorption and the threshold energy. Physical Review B, 28 (6). pp. 2921-2926. ISSN 1098-0121 http://resolver.caltech.edu/CaltechAUTHORS:20120706-142629255
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Two approaches for the determination of the background absorption (μ_0) in the extended x-ray-absorption fine structure (EXAFS) are presented. Both methods, experimental and computational, take advantage of the damping of the EXAFS amplitude resulting from the convolution with Gaussian functions of different widths. In the experimental method two or more spectra are collected with the use of different spectrometer slit widths, resulting in spectra of different resolutions for the same sample. In the computational approach the convolution is accomplished via a convolution algorithm. The intersection points of the resulting spectra are used to generate μ_0. At the absorption edge, the spectra intersect at a unique point, which is shown to be a measure of the threshold energy, E_0. Illustration of the two methods for background removal is given for a copper-foil sample. The computational approach is superior to the experimental method of damping the EXAFS spectra to give μ_0.
|Additional Information:||© 1983 The American Physical Society. Received 16 February 1983. The support of the National Science Foundation (Grant No. CHE-81-12589) and the National Institute of Health (Grant No. GM21111-09A) is gratefully acknowledged.|
|Usage Policy:||No commercial reproduction, distribution, display or performance rights in this work are provided.|
|Deposited By:||Tony Diaz|
|Deposited On:||06 Jul 2012 23:34|
|Last Modified:||26 Dec 2012 15:28|
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