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MeV ion scattering from thin Si single crystals: A novel approach to interface studies

Feldman, L. C. and Silverman, P. J. and Stensgaard, I. and Cheung, N. (1979) MeV ion scattering from thin Si single crystals: A novel approach to interface studies. Journal of Vacuum Science and Technology, 16 (5). p. 1457. ISSN 0022-5355. http://resolver.caltech.edu/CaltechAUTHORS:20120725-132543388

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Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1116/1.570220DOIUNSPECIFIED
http://avspublications.org/jvst/resource/1/jvstal/v16/i5/p1457_s1PublisherUNSPECIFIED
Additional Information:© 1979 American Vacuum Society. Received 13 September 1979. Work performed as a resident visitor at Bell Laboratories.
Classification Code:PACS: 68.20. + t, 79.20.Nc, 61.80.Jh, 61.80.Mk
Record Number:CaltechAUTHORS:20120725-132543388
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20120725-132543388
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:32722
Collection:CaltechAUTHORS
Deposited By: Ruth Sustaita
Deposited On:25 Jul 2012 20:51
Last Modified:26 Dec 2012 15:44

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