Horgen, H. (1979) Quantitative interpretation of electron micrographs using image processing techniques. Journal of Optics, 10 (4). pp. 157-167. ISSN 2040-8978 http://resolver.caltech.edu/CaltechAUTHORS:20120730-095433260
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Several different techniques for enhancing the contrast of electron micrographs or for extracting latent information with the aid of a computer are described. Enhancement of lattice-fringe images and of the weak-beam image of a dislocation dipole demonstrate a way to match experimental results with theoretical contrast predictions. Problems associated with the restoration of a weakly-scattering specimen imaged in bright-field are illustrated on focal series of catalase and of small gold clusters on a carbon substrate.
|Additional Information:||© 1979 Institute of Physics. Manuscript received in February 17, 1979. I wish to thank my adviser, R. E. Villagrana, for his unfailing support during the course of this research, and D. M. Maher for the provision of the weak-beam micrographs.|
|Subject Keywords:||Instrumentation and measurement Medical physics Biological physics Condensed matter: structural, mechanical & thermal|
|Classification Code:||PACS: 07.78.+s, 87.14.E-, 87.64.Ee, 07.05.Pj, 61.72.Ff|
|Official Citation:||Quantitative interpretation of electron micrographs using image processing techniques H Horgen 1979 J. Opt. 10 157|
|Usage Policy:||No commercial reproduction, distribution, display or performance rights in this work are provided.|
|Deposited By:||Ruth Sustaita|
|Deposited On:||30 Jul 2012 17:15|
|Last Modified:||30 Jul 2012 17:15|
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