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Quantitative interpretation of electron micrographs using image processing techniques

Horgen, H. (1979) Quantitative interpretation of electron micrographs using image processing techniques. Journal of Optics, 10 (4). pp. 157-167. ISSN 2040-8978 . http://resolver.caltech.edu/CaltechAUTHORS:20120730-095433260

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Abstract

Several different techniques for enhancing the contrast of electron micrographs or for extracting latent information with the aid of a computer are described. Enhancement of lattice-fringe images and of the weak-beam image of a dislocation dipole demonstrate a way to match experimental results with theoretical contrast predictions. Problems associated with the restoration of a weakly-scattering specimen imaged in bright-field are illustrated on focal series of catalase and of small gold clusters on a carbon substrate.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1088/0150-536X/10/4/002DOIUNSPECIFIED
http://iopscience.iop.org/0150-536X/10/4/002/PublisherUNSPECIFIED
Additional Information:© 1979 Institute of Physics. Manuscript received in February 17, 1979. I wish to thank my adviser, R. E. Villagrana, for his unfailing support during the course of this research, and D. M. Maher for the provision of the weak-beam micrographs.
Subject Keywords:Instrumentation and measurement Medical physics Biological physics Condensed matter: structural, mechanical & thermal
Classification Code:PACS: 07.78.+s, 87.14.E-, 87.64.Ee, 07.05.Pj, 61.72.Ff
Record Number:CaltechAUTHORS:20120730-095433260
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20120730-095433260
Official Citation: Quantitative interpretation of electron micrographs using image processing techniques H Horgen 1979 J. Opt. 10 157
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:32784
Collection:CaltechAUTHORS
Deposited By: Ruth Sustaita
Deposited On:30 Jul 2012 17:15
Last Modified:30 Jul 2012 17:15

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