Horgen, H. (1979) Quantitative interpretation of electron micrographs using image processing techniques. Journal of Optics, 10 (4). pp. 157-167. ISSN 2040-8978 http://resolver.caltech.edu/CaltechAUTHORS:20120730-095433260
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Abstract
Several different techniques for enhancing the contrast of electron micrographs or for extracting latent information with the aid of a computer are described. Enhancement of lattice-fringe images and of the weak-beam image of a dislocation dipole demonstrate a way to match experimental results with theoretical contrast predictions. Problems associated with the restoration of a weakly-scattering specimen imaged in bright-field are illustrated on focal series of catalase and of small gold clusters on a carbon substrate.
| Item Type: | Article |
|---|---|
| Additional Information: | © 1979 Institute of Physics. Manuscript received in February 17, 1979. I wish to thank my adviser, R. E. Villagrana, for his unfailing support during the course of this research, and D. M. Maher for the provision of the weak-beam micrographs. |
| Subject Keywords: | Instrumentation and measurement Medical physics Biological physics Condensed matter: structural, mechanical & thermal |
| Classification Code: | PACS: 07.78.+s, 87.14.E-, 87.64.Ee, 07.05.Pj, 61.72.Ff |
| Record Number: | CaltechAUTHORS:20120730-095433260 |
| Persistent URL: | http://resolver.caltech.edu/CaltechAUTHORS:20120730-095433260 |
| Related URLs: | |
| Official Citation: | Quantitative interpretation of electron micrographs using image processing techniques H Horgen 1979 J. Opt. 10 157 |
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. |
| ID Code: | 32784 |
| Collection: | CaltechAUTHORS |
| Deposited By: | Ruth Sustaita |
| Deposited On: | 30 Jul 2012 17:15 |
| Last Modified: | 30 Jul 2012 17:15 |
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