Gould, R. W. and Healey, J. T. (1975) Secondary fluorescent excitation in the scanning electron microscope: Improved sensitivity of energy dispersive analysis. Review of Scientific Instruments, 46 (10). pp. 1427-1428. ISSN 0034-6748 http://resolver.caltech.edu/CaltechAUTHORS:20120814-152848159
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Abstract
The use of secondary fluorescence for x‐ray energy spectroscopy in the scanning electron microscope has greatly enhanced both resolution and the lower limit of detection. This note describes a simple secondary fluorescence system. The x‐ray energy spectra taken from a stainless steel sample illustrate the advantages of this method.
| Item Type: | Article |
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| Additional Information: | © 1975 American Institute of Physics. Received 27 June 1975. Online Publication Date: 2 September 2008. |
| Subject Keywords: | X−RAY SPECTROSCOPY, ENERGY SPECTRA, FLUORESCENCE, SENSITIVITY, RESOLUTION, STAINLESS STEELS, ELECTRON MICROSCOPES |
| Classification Code: | PACS: 07.78.+s, 07.85.-m |
| Record Number: | CaltechAUTHORS:20120814-152848159 |
| Persistent URL: | http://resolver.caltech.edu/CaltechAUTHORS:20120814-152848159 |
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| Official Citation: | Secondary fluorescent excitation in the scanning electron microscope: Improved sensitivity of energy dispersive analysis R. W. Gould and J. T. Healey Rev. Sci. Instrum. 46, 1427 (1975); http://dx.doi.org/10.1063/1.1134022 |
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. |
| ID Code: | 33189 |
| Collection: | CaltechAUTHORS |
| Deposited By: | Ruth Sustaita |
| Deposited On: | 14 Aug 2012 22:50 |
| Last Modified: | 26 Dec 2012 15:59 |
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