O'Connor, S. D. and Gamble, R. C. and Eby, R. K. and Baldeschwieler, J. D. (1996) Noise reduction in atomic force microscopy: Resonance contact mode. Review of Scientific Instruments, 67 (2). pp. 393-396. ISSN 0034-6748 http://resolver.caltech.edu/CaltechAUTHORS:OCOrsi96
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Noise reduction has been accomplished in atomic force microscopy by applying a high frequency, low amplitude vibration to the cantilever while it is in contact with a surface. The applied excitation (>~200 kHz; ~1 nm) is acoustically coupled to the tip and dampens the resonance Q factors of the system. The applied frequency is well above the bandwidth of the acquisition system (50 kHz). We call this mode "resonance contact" mode. The nonlinear behavior of the tip–sample interaction allows the high frequency excitation to effectively broaden the frequency response of the system resonances.
|Additional Information:||©1996 American Institute of Physics. (Received 5 June 1995; accepted 6 November 1995) S.D.O. is supported by a NIH traineeship. The authors would like to thank R. Murray for helpful conversations. Also, the CIT authors thank Topometrix for the installation and maintenance of the Discoverer SPM system located in their laboratory.|
|Subject Keywords:||FREQUENCY DEPENDENCE; KHZ RANGE; MECHANICAL VIBRATIONS; NONLINEAR PROBLEMS; RESONANCE; SIGNAL–TO–NOISE RATIO; ATOMIC FORCE MICROSCOPY|
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|Deposited On:||01 Jun 2006|
|Last Modified:||26 Dec 2012 08:53|
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