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Transmission Electron Microscopy and Diffractometry of Materials (Third Edition)

Fultz, Brent and Howe, James M. (2007) Transmission Electron Microscopy and Diffractometry of Materials (Third Edition). Springer , Heidelberg. ISBN 978-3-540-73885-5 http://resolver.caltech.edu/CaltechAUTHORS:20121025-210157406

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Abstract

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM. This edition is not substantially longer than the second, but all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.


Item Type:Book
Funders:
Funding AgencyGrant Number
National Science FoundationUNSPECIFIED
Subject Keywords:diffraction; scattering; transmission electron microscopy; microscopy; electron energy loss spectrometry; energy dispersive x-ray spectrometry; electron spectrometry; dynamical diffraction; kinematical diffraction; physical optics; Patterson function; high resolution microscopy; inelastic scattering; elastic scattering; neutron scattering
Non-Subject Keywords:MS/APh 120; MS/APh 122
Record Number:CaltechAUTHORS:20121025-210157406
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20121025-210157406
Official Citation:B. Fultz and J. M. Howe, Transmission Electron Microscopy and Diffractometry of Materials, Third Edition, (Springer-Verlag, Heidelberg 2007).
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided. For use by the Caltech community only.
ID Code:35111
Collection:CaltechAUTHORS
Deposited By: Brent Fultz
Deposited On:06 Nov 2012 22:59
Last Modified:27 Dec 2012 02:55

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