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Integrated Self-Healing for mm-Wave Power Amplifiers

Bowers, Steven M. and Sengupta, Kaushik and Dasgupta, Kaushik and Parker, Benjamin D. and Hajimiri, Ali (2013) Integrated Self-Healing for mm-Wave Power Amplifiers. IEEE Transactions on Microwave Theory and Techniques, 61 (3). pp. 1301-1315. ISSN 0018-9480. doi:10.1109/TMTT.2013.2243750. https://resolver.caltech.edu/CaltechAUTHORS:20130424-154627947

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Abstract

Self-healing as a technique for improving performance and yield of millimeter-wave power amplifiers (PAs) against process variation and transistor mismatch, load impedance mismatch, and partial and total transistor failure is described and investigated. A 28-GHz PA is presented with three types of sensors, two types of actuators, data converters, and a digital algorithm block that are all integrated on a single chip to show the validity of the technique. Two algorithms are implemented to either maximize output power or to minimize dc power for a desired output power. Measurements from 20 chips show increased RF output power up to 3 dB or reduced dc power by 50% in backoff with a 50-Ω load. Self-healing with up to 4-1 voltage standing-wave ratio load impedance mismatch is verified and linear operation under nonconstant envelope modulation is shown to improve with healing. Self-healing after laser cutter induced transistor failure is verified and increases RF output power by up to 5.4 dB. The aggregate yield of the PA across several representative specifications is increased from 0% to 80% with self-healing.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1109/TMTT.2013.2243750DOIUNSPECIFIED
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6461483PublisherUNSPECIFIED
ORCID:
AuthorORCID
Hajimiri, Ali0000-0001-6736-8019
Additional Information:© 2013 IEEE. Manuscript received October 23, 2012; revised January 11, 2013; accepted January 15, 2013. Date of publication February 13, 2013; date of current version March 07, 2013. This work was supported by the Air Force Research Laboratory. This paper is an expanded paper from the IEEE RFIC Symposium, Montreal, QC, Canada, June 17–19, 2012. The authors would like to thank Prof. A. Babakhani, Rice University, Houston, TX, USA (formerly with the California Institute of Technology) and A. Chang, Massachusetts Institute of Technology (MIT), Cambridge, MA, USA (formerly with the California Institute of Technology), for their valuable technical discussions and contributions, as well as Dr. S. Raman, Defense Advanced Research Projects Agency (DARPA), Arlington, VA, USA, T. Quach, Air Force Research Laboratory (AFRL), Dayton, OH, USA, and C. Maxey, Booz Allen Hamilton (BAH), McLean, VA, USA, for support. The views expressed are those of the authors and do not reflect the official policy of the Department of Defense (DoD) or the U.S. Government.
Funders:
Funding AgencyGrant Number
Air Force Research Laboratory (AFRL)UNSPECIFIED
Defense Advanced Research Projects Agency (DARPA)UNSPECIFIED
Subject Keywords:Actuators, CMOS integrated circuits (ICs), digital control, power amplifiers (PAs), power generation, sensors, thermal sensors.
Other Numbering System:
Other Numbering System NameOther Numbering System ID
INSPEC Accession Number13355112
Issue or Number:3
DOI:10.1109/TMTT.2013.2243750
Record Number:CaltechAUTHORS:20130424-154627947
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20130424-154627947
Official Citation:Bowers, S.M.; Sengupta, K.; Dasgupta, K.; Parker, B.D.; Hajimiri, A., "Integrated Self-Healing for mm-Wave Power Amplifiers," Microwave Theory and Techniques, IEEE Transactions on , vol.61, no.3, pp.1301,1315, March 2013 doi: 10.1109/TMTT.2013.2243750
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:38105
Collection:CaltechAUTHORS
Deposited By: Ruth Sustaita
Deposited On:25 Apr 2013 16:23
Last Modified:09 Nov 2021 23:33

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