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High-precision torsional magnetometer: Application to two-dimensional electron systems

Eisenstein, J. P. (1985) High-precision torsional magnetometer: Application to two-dimensional electron systems. Applied Physics Letters, 46 (7). pp. 695-696. ISSN 0003-6951. http://resolver.caltech.edu/CaltechAUTHORS:EISapl85

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Abstract

A dc torsional magnetometer for use in high magnetic fields is described. With a resolution of 10^–12 J/T at 5 T and excellent rejection of background moments, this device has been used to study the de Haas–van Alphen effect in two-dimensional electron systems. This resolution is about 100 times that obtained with a commercially available superconducting quantum interference device magnetometer. The device is useful over a wide temperature range including that below 1 K.


Item Type:Article
Additional Information:Copyright © 1985 American Institute of Physics (Received 30 November 1984; accepted 14 January 1985) It is a pleasure to thank V. Narayanamurti and H. L. Störmer for much encouragement and many enlightening discussions. Useful conversations with G. Agnolet are also appreciated.
Subject Keywords:ELECTRONS; RESOLUTION; MAGNETOMETERS; DESIGN; ELECTRON GAS; MAGNETIC SUSCEPTIBILITY; HETEROJUNCTIONS; MAGNETIC FIELDS; DE HAAS–VAN ALPHEN EFFECT; TORQUE; CALIBRATION
Record Number:CaltechAUTHORS:EISapl85
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:EISapl85
Alternative URL:http://dx.doi.org/10.1063/1.95478
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:4073
Collection:CaltechAUTHORS
Deposited By: Archive Administrator
Deposited On:26 Jul 2006
Last Modified:26 Dec 2012 08:57

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