Ma, E. and Workman, T. W. and Johnson, W. L. and Nicolet, M-A. (1989) Ion mixing of metal/Al bilayers near 77 K. Applied Physics Letters, 54 (5). pp. 413-415. ISSN 0003-6951 http://resolver.caltech.edu/CaltechAUTHORS:MAEapl89
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The efficiency of interfacial ion mixing is measured for metal/Al (metal=Ti, Cr, Ni, and Mo) thin-film bilayers irradiated with 285 keV Xe + ions near 77 K. The results indicate that, as a group, mixing of 3d-metal/Al pairs irradiated by Xe can be explained by neither a pure binary collision cascade nor a pure thermal spike model. Such a situation should exist; that it should be found at the average atomic numbers of the present bilayers is consistent with recent theoretical predictions.
|Additional Information:||Copyright © 1989 American Institute of Physics. Received 19 September 1988; accepted 20 November 1988. The authors thank Dr. R. S. Averback and Dr. Y.-T. Cheng for useful comments and discussions. This work was supported in part by National Science Foundation-Materials Research Group-DMR-8811795.|
|Subject Keywords:||MIXING; LAYERS; PHYSICAL RADIATION EFFECTS; NICKEL; TITANIUM; MOLYBDENUM; CHROMIUM; ALUMINIUM; ION COLLISIONS; XENON IONS; COLLISIONS; THIN FILMS; BILAYERS|
|Usage Policy:||No commercial reproduction, distribution, display or performance rights in this work are provided.|
|Deposited By:||Tony Diaz|
|Deposited On:||07 Aug 2006|
|Last Modified:||26 Dec 2012 08:58|
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