Vendroux, G. and Knauss, W. G. (1994) Deformation Measurements at the Sub-Micron Size Scale: II. Refinements in the Algorithm for Digital Image Correction. California Institute of Technology , Pasadena, CA. (Unpublished) http://resolver.caltech.edu/CaltechAUTHORS:GALCITSM94-5
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Improvements are proposed in the application of the Digital Image Correlation method, a technique that compares digital images of a specimen surface before and after deformation to deduce its sureface (2-D) displacement field and strains. These refinements, tested on translations and rigid body rotations were significant with regard to the computer efficiency and covergence properties of the method. In addition, the formulation of the algorithm was extended so as to compute the three-dimensional surface displacement field from Scanning Tunneling Microscope tomographies of a deforming specimen. The reolsution of this new displacement measuring method at the namometer scale was assessed on translation and uniaxial tensile tests and was found to be 4.8 nm for in-plane displacement components and 1.5 nm for the out-of-plane one spanning a 10 x 10 μm area.
|Item Type:||Report or Paper (Technical Report)|
|Additional Information:||This work has been supported by the National Science Foundation under grant MSS 9109973 for the hardware component of the STM. Also additional assistance through the Office of Naval Research (grant N00014-91-5-1427) and the Albert and Marguerite Ramond fellowship is gratefully acknowledged. In addition, the authors wish to thank H. Lu, graduate student, for his help in providing some of the experimental data.|
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|Deposited On:||10 Jun 2005|
|Last Modified:||26 Dec 2012 08:40|
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