Vendroux, G. and Knauss, W. G. (1994) Submicron Deformation Field Measurements II: Improved Digital Image Correlation. California Institute of Technology , Pasadena, CA. (Unpublished) http://resolver.caltech.edu/CaltechAUTHORS:GALCITSM94-5a
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This is the second paper in a series of three devoted to the applicaiton of Scanning Tunneling Microscopy to mechanics problems. In this paper improvements to the Digital Image Correlation method are outlined, a technique that compares digital images of a specimen surface before and after deformation to deduce its (2-D) surface displacement field and strains. The necessity of using the framework of large deformation theory for accurately addressing rigid body rotations to reduce associated errors in the strain components is pointed out. In addition, the algorithm is extended to compute the three-dimensional surface displacement field from Scanning Tunneling Microscope data; also, significant improvements are achieved in the rate as well as the robustness of the convergence. For Scanning Tunneling Microscopy topographs the resolution yields 4.8 nm for the in-plane and 1.5 nm for the out-of-plane displacement components spanning an area of 10 μm x 10 μm.
|Item Type:||Report or Paper (Technical Report)|
|Additional Information:||This work has been supported by the National Science Foundation under grant MSS 9109973 for the hardware component of the STM. Also substantial assistance through the Office of Naval Research (grant N00014-91-5-1427), with Dr. Peter Schmidt as the monitor, and through support via Albert and Marguerite Ramond fellowships is gratefully acknowledged. In addition, the authors wish to thank H. Lu, graduate student, for his help in providing some of the experimental speckle/CCD data.|
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|Deposited On:||10 Jun 2005|
|Last Modified:||26 Dec 2012 08:40|
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