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Monolithic InP-Based Grating Spectrometer for Wavelength-Division Multiplexed Systems at 1.5 μm

Soole, J. B. D. and Scherer, A. and Leblanc, H. P. and Andreadakis, N. C. and Bhat, R. and Koza, M. A. (1991) Monolithic InP-Based Grating Spectrometer for Wavelength-Division Multiplexed Systems at 1.5 μm. Electronics Letters, 27 (2). pp. 132-134. ISSN 0013-5194. http://resolver.caltech.edu/CaltechAUTHORS:SOOel91

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Abstract

A monolithic InP-based grating spectrometer for use in wavelength-division multiplexed systems at 1.5 μm is reported. The spectrometer uses a single etched reflective focusing diffraction grating and resolves >50 channels at 1 nm spacing with a ~0.3nm channel width and at least 19dB channel isolation. Operation is essentially of the state of the input polarisation.


Item Type:Article
Additional Information:©1991 IEE. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the IEE.
Subject Keywords:Spectrometry, Optical communication
Record Number:CaltechAUTHORS:SOOel91
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:SOOel91
Alternative URL:http://ieeexplore.ieee.org/iel1/2220/2713/00083163.pdf
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:454
Collection:CaltechAUTHORS
Deposited By: Archive Administrator
Deposited On:20 Jun 2005
Last Modified:26 Dec 2012 08:40

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