Harmonically-related diffraction gratings-based interferometer for quadrature phase measurements

Abstract

We demonstrate the use of shallow diffraction gratings for quadrature phase interferometry. A single shallow diffraction grating-based Michelson interferometer yields only trivial (0° or 180°) phase shift between different output ports. In comparison, a combination of two parallel shallow diffraction gratings can be useful to achieve desired phase shifts (e.g., 90° for quadrature phase interferometry). We show that the phase at different output ports of a grating-pair based interferometer can be adjusted by shearing the two gratings with respect to each other. Two harmonically-related diffraction gratings are used to demonstrate phase shift control at the output ports of a modified Michelson interferometer. Our experimental data is in good agreement with theory.