Zhang, Z. and Roukes, M. L. and Hammel, P. C. (1996) Sensitivity and spatial resolution for electron-spin-resonance detection by magnetic resonance force microscopy. Journal of Applied Physics, 80 (12). pp. 6931-6938. ISSN 0021-8979 http://resolver.caltech.edu/CaltechAUTHORS:ZHAjap96
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Abstract
The signal intensity of electron spin resonance in magnetic resonance force microscopy (MRFM) experiments employing periodic saturation of the electron spin magnetization is determined by four parameters: the rf field H1, the modulation level of the bias field Hm, the spin relaxation time tau1, and the magnetic size R([partial-derivative]H/[partial-derivative]z) of the sample. Calculations of the MRFM spectra obtained from a 2,2-diphenyl-1-picrylhydrazyl particle have been performed for various conditions. The results are compared with experimental data and excellent agreement is found. The systematic variation of the signal intensity as a function of H1 and Hm provides a powerful tool to characterize the MRFM apparatus.
| Item Type: | Article |
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| Additional Information: | ©1996 American Institute of Physics. (Received 19 October 1995; accepted 31 August 1996) The authors would like to thank Dr. P.E. Wigen for helpful discussions. This work was performed under the auspices of the U.S. Department of Energy. |
| Subject Keywords: | ELECTRON SPIN RESONANCE; SPATIAL RESOLUTION; MAGNETIZATION; ORGANIC COMPOUNDS; MICROSCOPY; RELAXATION TIME; MAGNETIC FIELDS; LINE WIDTHS; MAGNETIC FORCE MICROSCOPY; ESR |
| Record Number: | CaltechAUTHORS:ZHAjap96 |
| Persistent URL: | http://resolver.caltech.edu/CaltechAUTHORS:ZHAjap96 |
| Alternative URL: | http://dx.doi.org/10.1063/1.363767 |
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. |
| ID Code: | 4767 |
| Collection: | CaltechAUTHORS |
| Deposited By: | Archive Administrator |
| Deposited On: | 06 Sep 2006 |
| Last Modified: | 26 Dec 2012 09:01 |
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