Baselt, David R. and Baldeschwieler, John D. (1994) Imaging spectroscopy with the atomic force microscope. Journal of Applied Physics, 76 (1). pp. 33-38. ISSN 0021-8979 http://resolver.caltech.edu/CaltechAUTHORS:BASjap94
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Force curve imaging spectroscopy involves acquiring a force-distance curve at each pixel of an atomic force microscope image. Processing of the resulting data yields images of sample hardness and tip-sample adhesion. These images resemble Z modulation images and the sum of forward and reverse friction images, respectively, and like them exhibit a number of potentially misleading contrast mechanisms. In particular, XY tip motion has a pronounced effect on hardness images and the meniscus force on adhesion images.
|Additional Information:||Copyright © 1994 American Institute of Physics. Received 15 November 1993; accepted 5 March 1994. This work was supported in part by a grant from Ford Motor Company and a NSF predoctoral fellowship (D.B.). We thank Topometrix, Inc. for the use of the TMX2000 electronic control unit and its associated computer hardware.|
|Subject Keywords:||ATOMIC FORCE MICROSCOPY; SPECTROSCOPY; IMAGES; HARDNESS; ADHESION; ELASTICITY|
|Usage Policy:||No commercial reproduction, distribution, display or performance rights in this work are provided.|
|Deposited By:||Lindsay Cleary|
|Deposited On:||14 Sep 2006|
|Last Modified:||26 Dec 2012 09:02|
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