Baselt, David R. and Baldeschwieler, John D. (1994) Imaging spectroscopy with the atomic force microscope. Journal of Applied Physics, 76 (1). pp. 33-38. ISSN 0021-8979 http://resolver.caltech.edu/CaltechAUTHORS:BASjap94
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Abstract
Force curve imaging spectroscopy involves acquiring a force-distance curve at each pixel of an atomic force microscope image. Processing of the resulting data yields images of sample hardness and tip-sample adhesion. These images resemble Z modulation images and the sum of forward and reverse friction images, respectively, and like them exhibit a number of potentially misleading contrast mechanisms. In particular, XY tip motion has a pronounced effect on hardness images and the meniscus force on adhesion images.
| Item Type: | Article |
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| Additional Information: | Copyright © 1994 American Institute of Physics. Received 15 November 1993; accepted 5 March 1994. This work was supported in part by a grant from Ford Motor Company and a NSF predoctoral fellowship (D.B.). We thank Topometrix, Inc. for the use of the TMX2000 electronic control unit and its associated computer hardware. |
| Subject Keywords: | ATOMIC FORCE MICROSCOPY; SPECTROSCOPY; IMAGES; HARDNESS; ADHESION; ELASTICITY |
| Record Number: | CaltechAUTHORS:BASjap94 |
| Persistent URL: | http://resolver.caltech.edu/CaltechAUTHORS:BASjap94 |
| Alternative URL: | http://dx.doi.org/10.1063/1.357150 |
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. |
| ID Code: | 4938 |
| Collection: | CaltechAUTHORS |
| Deposited By: | Lindsay Cleary |
| Deposited On: | 14 Sep 2006 |
| Last Modified: | 26 Dec 2012 09:02 |
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