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Imaging spectroscopy with the atomic force microscope

Baselt, David R. and Baldeschwieler, John D. (1994) Imaging spectroscopy with the atomic force microscope. Journal of Applied Physics, 76 (1). pp. 33-38. ISSN 0021-8979. http://resolver.caltech.edu/CaltechAUTHORS:BASjap94

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Abstract

Force curve imaging spectroscopy involves acquiring a force-distance curve at each pixel of an atomic force microscope image. Processing of the resulting data yields images of sample hardness and tip-sample adhesion. These images resemble Z modulation images and the sum of forward and reverse friction images, respectively, and like them exhibit a number of potentially misleading contrast mechanisms. In particular, XY tip motion has a pronounced effect on hardness images and the meniscus force on adhesion images.


Item Type:Article
Additional Information:Copyright © 1994 American Institute of Physics. Received 15 November 1993; accepted 5 March 1994. This work was supported in part by a grant from Ford Motor Company and a NSF predoctoral fellowship (D.B.). We thank Topometrix, Inc. for the use of the TMX2000 electronic control unit and its associated computer hardware.
Subject Keywords:ATOMIC FORCE MICROSCOPY; SPECTROSCOPY; IMAGES; HARDNESS; ADHESION; ELASTICITY
Record Number:CaltechAUTHORS:BASjap94
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:BASjap94
Alternative URL:http://dx.doi.org/10.1063/1.357150
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:4938
Collection:CaltechAUTHORS
Deposited By: Lindsay Cleary
Deposited On:14 Sep 2006
Last Modified:26 Dec 2012 09:02

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